Valence band parameters for Hg1−xMgxTe epitaxial layers

1998 ◽  
Vol 184-185 (1-2) ◽  
pp. 1209-1213
Author(s):  
K Paesler
1998 ◽  
Vol 184-185 ◽  
pp. 1209-1213 ◽  
Author(s):  
K. Paesler ◽  
B. König ◽  
M. von Truchsess ◽  
A. Pfeuffer-Jeschke ◽  
S. Oehling ◽  
...  

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-693-C4-696 ◽  
Author(s):  
J. P. LAURENTI ◽  
P. ROENTGEN ◽  
K. WOLTER ◽  
K. SEIBERT ◽  
H. KURZ ◽  
...  
Keyword(s):  

2002 ◽  
Vol 719 ◽  
Author(s):  
Masashi Kato ◽  
Masaya Ichimura ◽  
Eisuke Arai ◽  
Shigehiro Nishino

AbstractEpitaxial layers of 4H-SiC are grown on (0001) substrates inclined toward <1120> and <1100> directions. Defects in these films are characterized by deep level transient spectroscopy (DLTS) in order to clarify the dependence of concentrations and activation energies on substrate inclination. DLTS results show no such dependence on substrate inclination but show thickness dependence of the concentration.


PIERS Online ◽  
2006 ◽  
Vol 2 (6) ◽  
pp. 562-566 ◽  
Author(s):  
Chun-Nan Chen ◽  
Kao-Feng Yarn ◽  
Win Jet Luo ◽  
Jih-Chen Chiang ◽  
Ikai Lo ◽  
...  

1989 ◽  
Vol 54 (11) ◽  
pp. 2933-2950
Author(s):  
Emerich Erdös ◽  
Petr Voňka ◽  
Josef Stejskal ◽  
Přemysl Klíma

This paper represents a continuation and ending of the kinetic study of the gallium arsenide formation, where a so-called inhomogeneous model is proposed and quantitatively formulated in five variants, in which two kinds of active centres appear. This model is compared both with the experimental data and with the previous sequence of homogeneous models.


2014 ◽  
Vol 5 (1) ◽  
Author(s):  
Nasser Alidoust ◽  
Guang Bian ◽  
Su-Yang Xu ◽  
Raman Sankar ◽  
Madhab Neupane ◽  
...  

1994 ◽  
Vol 312 (1-2) ◽  
pp. 151-156 ◽  
Author(s):  
Charles H.F. Peden ◽  
Neal D. Shinn
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document