Draw-ratio-dependent morphology of biaxially oriented polypropylene films as determined by atomic force microscopy

Polymer ◽  
2000 ◽  
Vol 41 (6) ◽  
pp. 2213-2218 ◽  
Author(s):  
H.-Y Nie ◽  
M.J Walzak ◽  
N.S McIntyre
Keyword(s):  
Atomic Force Microscopy ◽  
Draw Ratio ◽  
Force Microscopy ◽  
Atomic Force ◽  
Biaxially Oriented Polypropylene ◽  
Oriented Polypropylene ◽  
Ratio Dependent ◽  
Polypropylene Films

Research on the Characterization and the Properties of SiOx Coating on Plastic Film

2010 ◽  
Vol 174 ◽  
pp. 486-489
Author(s):  
Gai Mei Zhang ◽  
Qiang Chen ◽  
Cun Fu He ◽  
Hui Qin Zhu ◽  
Yu Ling Li
Keyword(s):  
Contact Angle ◽  
Atomic Force Microscopy ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
Plastic Film ◽  
Force Microscopy ◽  
Atomic Force ◽  
Biaxially Oriented Polypropylene ◽  
Oriented Polypropylene ◽  
Pet Film

The nano-thickness SiOx deposited on polyethylene terephthalate (PET) film and biaxially oriented polypropylene (BOPP) were fabricated by plasma enhanced chemical vapor deposition (PECVD) in a radio frequency (13.56 MHz) glow discharge. The nano-coatings were characterized by using Fourier transform infrared spectroscopy (FTIR), atomic force microscopy (AFM) and ultrasonic atomic force microscopy (UAFM). With AFM and UAFM, the topography and ultrasonic amplitude images were obtained. In particular, the UAFM images reveal the subsurface defects in the coating. The tensile property, contact angle and OTR of the PET present and absent of the SiOx coating were investigated experimentally respectively. The results can show that the SiOx coating can improved the barrier and the tensile strength.

An atomic force microscopy study of corona-treated polypropylene films

1993 ◽  
Vol 64 (3) ◽  
pp. 197-203 ◽  
Author(s):  
R.M. Overney ◽  
R. Lüthi ◽  
H. Haefke ◽  
J. Frommer ◽  
E. Meyer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polypropylene Films

BIAXIALLY ORIENTED POLYPROPYLENE FILM FOR AFM TIP CHARACTERIZATION

NANO ◽  
2014 ◽  
Vol 09 (03) ◽  
pp. 1450029 ◽  
Author(s):  
GUOQIANG HAN ◽  
YUQIN CHEN ◽  
BINGWEI HE
Keyword(s):  
Three Dimensional ◽  
Direct Interaction ◽  
Reconstruction Algorithm ◽  
Nanometer Scale ◽  
Polypropylene Film ◽  
Force Microscopy ◽  
Atomic Force ◽  
Biaxially Oriented Polypropylene ◽  
Oriented Polypropylene ◽  
Determining Factor

Atomic force microscopy (AFM) investigating the sample morphology is the process of direct interaction between tip and surface features. The geometry of probe tip is a determining factor in correcting AFM images distorted by tip size itself. A quantitative knowledge of the current tip shape is needed to improve the reliability of AFM images. The biaxially oriented polypropylene (BOPP) film was fabricated and used as tip characterizer to estimate the morphology of AFM Si tip based on the blind reconstruction algorithm. The surface of the BOPP film was covered by nanometer-scale-sized structures which ensure that the tip profile can be determined accurately. Without independent knowledge of the sample, the three-dimensional (3D) shape of Si probe tip was obtained with high aspect ratio. BOPP film is not only a simple, cheap material but also a soft one which can also avoid tip damage in scanning. It was demonstrated reliable and suitable for tip characterization.

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