Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors
2003 ◽
Vol 427
(1-2)
◽
pp. 127-132
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2007 ◽
2014 ◽
Vol 16
(19)
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pp. 8843
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Keyword(s):
2000 ◽
Keyword(s):
2013 ◽
Vol 264
◽
pp. 811-815
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2010 ◽
Vol 253
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pp. 012081
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