The structural, optical and secondary electron emission properties of MgO and Mg–O–Cs thin films prepared by ion beam assisted deposition

1999 ◽  
Vol 355-356 ◽  
pp. 55-59 ◽  
Author(s):  
Soon Joon Rho ◽  
Soon Moon Jeong ◽  
Hong Koo Baik ◽  
Kie Moon Song
Keyword(s):  
Thin Films ◽  
Electron Emission ◽  
Secondary Electron ◽  
Ion Beam ◽  
Secondary Electron Emission ◽  
Emission Properties ◽  
Ion Beam Assisted Deposition

SEM analysis of DC magnetron sputtered beryllium films

1988 ◽  
Vol 46 ◽  
pp. 960-961
Author(s):  
E. F. Lindsey ◽  
C. W. Price ◽  
E. L. Pierce ◽  
E. J. Hsieh
Keyword(s):  
Fine Structure ◽  
Electron Emission ◽  
Secondary Electron ◽  
Low Voltage ◽  
Ion Beam ◽  
Secondary Electron Emission ◽  
Sem Analysis ◽  
Fused Silica ◽  
Grain Structure ◽  
Silica Substrate

Columnar structures produced by DC magnetron sputtering can be altered by using RF biased sputtering or by exposing the film to nitrogen pulses during sputtering, and these techniques are being evaluated to refine the grain structure in sputtered beryllium films deposited on fused silica substrates. Beryllium is brittle, and fractures in sputtered beryllium films tend to be intergranular; therefore, a convenient technique to analyze grain structure in these films is to fracture the coated specimens and examine them in an SEM. However, fine structure in sputtered deposits is difficult to image in an SEM, and both the low density and the low secondary electron emission coefficient of beryllium seriously compound this problem. Secondary electron emission can be improved by coating beryllium with Au or Au-Pd, and coating also was required to overcome severe charging of the fused silica substrate even at low voltage. The coating structure can obliterate much of the fine structure in beryllium films, but reasonable results were obtained by using the high-resolution capability of an Hitachi S-800 SEM and either ion-beam coating with Au-Pd or carbon coating by thermal evaporation.

Secondary electron emission of metal oxide sputtered thin films

1990 ◽  
Vol 191 (2) ◽  
pp. 361-367 ◽  
Author(s):  
N. Croitoru ◽  
A. Seidman ◽  
K. Yassin
Keyword(s):  
Thin Films ◽  
Metal Oxide ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission

Secondary electron emission properties of double-layer B-doped diamond films

2020 ◽  
Vol 106 ◽  
pp. 107826 ◽  
Author(s):  
Kongting Wei ◽  
Ruozheng Wang ◽  
Jie Li ◽  
Biye Liu ◽  
Qiang Wei ◽  
...  
Keyword(s):  
Double Layer ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Diamond Films ◽  
Emission Properties
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