Surface ionization molecular beam detector with a magnetic mass filter: application to absolute differential reactive cross section measurements. (GB)

Vacuum ◽  
1976 ◽  
Vol 26 (12) ◽  
pp. 558
Keyword(s):  
Cross Section ◽  
Molecular Beam ◽  
Surface Ionization ◽  
Mass Filter ◽  
Absolute Differential ◽  
Magnetic Mass ◽  
Reactive Cross Section

Molecular beam study of the K + CF3I reaction: Detailed differential reactive cross section and energy disposal

1974 ◽  
Vol 60 (7) ◽  
pp. 2822-2827 ◽  
Author(s):  
A. M. Rulis ◽  
B. E. Wilcomb ◽  
R. B. Bernstein
Keyword(s):  
Cross Section ◽  
Molecular Beam ◽  
Reactive Cross Section

Molecular Beam Study of the K+CH3I Reaction: Energy Dependence of the Detailed Differential Reactive Cross Section

1972 ◽  
Vol 57 (12) ◽  
pp. 5497-5515 ◽  
Author(s):  
Alan M. Rulis ◽  
Richard B. Bernstein
Keyword(s):  
Energy Dependence ◽  
Cross Section ◽  
Molecular Beam ◽  
Reaction Energy ◽  
Reactive Cross Section

Near-Surface Aggregation of Sn In Heavily Sn-Doped GaAs Films Grown By Molecular Beam Epitaxy

1985 ◽  
Vol 43 ◽  
pp. 368-369
Author(s):  
S. H. Chen
Keyword(s):  
Molecular Beam Epitaxy ◽  
Cross Section ◽  
Electron Spectroscopy ◽  
Molecular Beam ◽  
Surface Segregation ◽  
Secondary Ion Mass Spectrometry ◽  
Specimen Preparation ◽  
Near Surface ◽  
Gaas Films ◽  
Secondary Ion

Sn has been used extensively as an n-type dopant in GaAs grown by molecular-beam epitaxy (MBE). The surface accumulation of Sn during the growth of Sn-doped GaAs has been observed by several investigators. It is still not clear whether the accumulation of Sn is a kinetically hindered process, as proposed first by Wood and Joyce, or surface segregation due to thermodynamic factors. The proposed donor-incorporation mechanisms were based on experimental results from such techniques as secondary ion mass spectrometry, Auger electron spectroscopy, and C-V measurements. In the present study, electron microscopy was used in combination with cross-section specimen preparation. The information on the morphology and microstructure of the surface accumulation can be obtained in a fine scale and may confirm several suggestions from indirect experimental evidence in the previous studies.

Integral total reactive cross section calculations within the infinite order sudden approximation

1979 ◽  
Vol 68 (2-3) ◽  
pp. 378-381 ◽  
Author(s):  
M. Baer ◽  
V. Khare ◽  
D.J. Kouri
Keyword(s):  
Cross Section ◽  
Infinite Order ◽  
Sudden Approximation ◽  
Reactive Cross Section

How to select the best condition for operating a positive ion source of molecular beam surface ionization typea)

1994 ◽  
Vol 65 (5) ◽  
pp. 1766-1769 ◽  
Author(s):  
Hiroyuki Kawano ◽  
Katsushi Ohgami ◽  
Kiyohiko Funato ◽  
Junji Nakamura
Keyword(s):  
Molecular Beam ◽  
Ion Source ◽  
Surface Ionization ◽  
Beam Surface ◽  
Positive Ion
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