Physico-chemical characterization of β-In2S3 thin films synthesized by solid-state reaction, induced by annealing, of the constituents sequentially deposited in thin layers

Vacuum ◽  
2000 ◽  
Vol 56 (2) ◽  
pp. 101-106 ◽  
Author(s):  
N Barreau ◽  
S Marsillac ◽  
J.C Bernède
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Solid State Reaction ◽  
Chemical Characterization ◽  
Thin Layers ◽  
Physico Chemical

Physico-Chemical Characterization of Drugs and Drug Forms in the Solid State

ChemInform ◽  
2004 ◽  
Vol 35 (25) ◽  
Author(s):  
A. Marini ◽  
V. Berbenni ◽  
G. Bruni ◽  
P. Cofrancesco ◽  
F. Giordano ◽  
...  
Keyword(s):  
Solid State ◽  
Chemical Characterization ◽  
Physico Chemical

Physico-chemical characterization of spray-deposited CuInS2 thin films

2001 ◽  
Vol 382 (1-2) ◽  
pp. 39-46 ◽  
Author(s):  
M.C Zouaghi ◽  
T.Ben Nasrallah ◽  
S Marsillac ◽  
J.C Bernède ◽  
S Belgacem
Keyword(s):  
Thin Films ◽  
Chemical Characterization ◽  
Physico Chemical ◽  
Cuins2 Thin Films

Physico-chemical characterization of molybdenum dichalcogenide thin films

1991 ◽  
Vol 28 (4) ◽  
pp. 347-354 ◽  
Author(s):  
J.C. Bernede ◽  
N. Manai ◽  
J. Pouzet ◽  
M. Morsli ◽  
A. Ouadah
Keyword(s):  
Thin Films ◽  
Chemical Characterization ◽  
Physico Chemical

Physico-Chemical Characterization of Drugs and Drug Forms in the Solid State

2003 ◽  
Vol 2 (4) ◽  
pp. 303-321 ◽  
Author(s):  
A. Marini ◽  
V. Berbenni ◽  
G. Bruni ◽  
P. Cofrancesco ◽  
F. Giordano ◽  
...  
Keyword(s):  
Solid State ◽  
Chemical Characterization ◽  
Physico Chemical

Physico-Chemical Characterization of Sprayed ?-Ag2S Thin Films

2000 ◽  
Vol 181 (2) ◽  
pp. 405-412 ◽  
Author(s):  
H. Dlala ◽  
M. Amlouk ◽  
T. Ben Nasrallah ◽  
J.C. Bernede ◽  
S. Belgacem
Keyword(s):  
Thin Films ◽  
Chemical Characterization ◽  
Physico Chemical

Physico-chemical characterization of the effect of excimer laser irradiation on PMMA thin films

1997 ◽  
Vol 109-110 ◽  
pp. 218-221 ◽  
Author(s):  
S Beauvois ◽  
D Renaut ◽  
R Lazzaroni ◽  
L.D Laude ◽  
J.L Bredas
Keyword(s):  
Thin Films ◽  
Laser Irradiation ◽  
Excimer Laser ◽  
Chemical Characterization ◽  
Physico Chemical ◽  
Excimer Laser Irradiation

Characterization of Zirconium Germanosilicide Formed by Solid State Reaction of ZR With Sil−xGex Alloys

1995 ◽  
Vol 402 ◽  
Author(s):  
Z. Wang ◽  
D. B. Aldrich ◽  
P. Goeller ◽  
R. J. Nemanich ◽  
D. E. Sayers
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Sheet Resistance ◽  
Solid State Reaction ◽  
Solid Phase ◽  
Solid Phase Reaction ◽  
Phase Reaction ◽  
Final Phase ◽  
The Stability

AbstractWe have investigated the electrical and structural properties of zirconium germanosilicide (Zr-Si-Ge) films formed during the Zr-Sil−xGex solid state reaction. Thin films of C49 Zr(Si1−xGex)2 were formed from the solid phase reaction of Zr and Si1−xGex bilayer structures. It was observed that Zr reacts uniformly with the Sil−xGex alloy and that C49 Zr(Si1−x Gex)2 is the final phase of the Zr-Si1−xGex, solid phase reaction (such tht y = x) for all compositions examined (x = 0.20, 0.33, and 0.50). The sheet resistance of the Zr(Si1−xGex)2 thin films were higher than the sheet resistance measured for ZrSi2 films. The stability of Zr(Sil−x Gex)2 in contact with Si1−Gex was investigated and no germanium segregation was detected in the Zr(Si1−xGex)2/Si1−Gex structures.

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