Short and long range order of the morphology of silk from Latrodectus hesperus (Black Widow) as characterized by atomic force microscopy

1999 ◽  
Vol 24 (2-3) ◽  
pp. 151-157 ◽  
Author(s):  
S.A.C Gould ◽  
K.T Tran ◽  
J.C Spagna ◽  
A.M.F Moore ◽  
J.B Shulman
Keyword(s):  
Atomic Force Microscopy ◽  
Long Range ◽  
Range Order ◽  
Long Range Order ◽  
Black Widow ◽  
Latrodectus Hesperus ◽  
Force Microscopy ◽  
Atomic Force

FORMATION, STRUCTURE AND PROPERTIES OF HIGHLY ORDERED SUB-30-nm PHASE CHANGE MATERIALS (GST) NANOPARTICLE ARRAYS

2010 ◽  
Vol 17 (04) ◽  
pp. 405-410 ◽  
Author(s):  
YUANBAO LIAO ◽  
JIAJIA WU ◽  
LING XU ◽  
FEI YANG ◽  
WENQING LIU ◽  
...  
Keyword(s):  
Phase Change ◽  
Long Range ◽  
Phase Change Materials ◽  
Particle Density ◽  
Photonic Band Gap ◽  
Range Order ◽  
Long Range Order ◽  
Nanoparticle Arrays ◽  
Force Microscopy ◽  
Atomic Force

Chalcogenide phase change material Ge1Sb2Te4 (GST) nanoparticle arrays with long-range-order were fabricated by using a monolayer of self-assembled polystyrene (PS) spheres as mask. The morphology of nanoparticle arrays can be controlled via changing RIE processing conditions. Images of atomic force microscopy (AFM) and scanning electron microscopy (SEM) show that highly uniform GST nanoparticle arrays with particle density around 109 cm-2 were formed. The sizes of nanoparticles can be reduced to a tiny diameter in the range of 30–40 nm (top diameter). The GST nanoparticle arrays exhibit a prominent peak near 580 nm in reflectance spectra, which indicates that they possess a photonic band gap. These results confirm that GST nanoparticle arrays have a 2D periodicity and long-range order. The method of nanosphere lithograph may apply to manufacturing of high density memory devices based on phase change-based memory materials.

Extending the limits of direct force measurements: colloidal probes from sub-micron particles

Nanoscale ◽  
2017 ◽  
Vol 9 (27) ◽  
pp. 9491-9501 ◽  
Author(s):  
Nicolas Helfricht ◽  
Andreas Mark ◽  
Livie Dorwling-Carter ◽  
Tomaso Zambelli ◽  
Georg Papastavrou
Keyword(s):  
Atomic Force Microscopy ◽  
Long Range ◽  
External Pressure ◽  
Silica Particles ◽  
Force Measurements ◽  
Force Microscopy ◽  
Small Probe ◽  
Atomic Force ◽  
Long Range Interactions ◽  
Colloidal Probes

Long-range interactions between sub-micron silica particles have been determined by means of a combination of atomic force microscopy (AFM) with nanofluidics, which allows for a temporary immobilization of small probe particles by an external pressure.

The Nanostructure and Nanomechanics of a Novel Black Widow Spider Silk Assessed Using Atomic Force Microscopy

2010 ◽  
Author(s):  
Simon Y. Tang ◽  
Yang Hsia ◽  
Craig Vierra
Keyword(s):  
Atomic Force Microscopy ◽  
Spider Silk ◽  
Material Behavior ◽  
Black Widow ◽  
Nanoscale Material ◽  
Black Widow Spider ◽  
Force Microscopy ◽  
Atomic Force ◽  
Black Widow Spiders ◽  
Widow Spider

The black widow spider produces numerous silk types that serve unique biological and mechanical functions. Recently, a novel member of the spider silk family, Pyroform Spidroin 1 (PySp1), was identified from the attachment discs of black widow spiders. Here we investigate the nanostructure and the nanoscale material behavior of native PySp1 silks using atomic force microscopy.

scholarly journals Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

2014 ◽  
Vol 5 ◽  
pp. 386-393 ◽  
Author(s):  
Adam Sweetman ◽  
Andrew Stannard
Keyword(s):  
Atomic Force Microscopy ◽  
Long Range ◽  
Density Functional ◽  
Density Functional Theory Calculations ◽  
Extrapolation Method ◽  
Atomic Scale ◽  
Site Specific ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fitting Method

In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift) is often far from trivial. In most cases there is a significant contribution to the total tip–sample force due to non-site-specific van der Waals and electrostatic forces. Typically, the contribution from these forces must be removed before the results of the experiment can be successfully interpreted, often by comparison to density functional theory calculations. In this paper we compare the ‘on-minus-off’ method for extracting site-specific forces to a commonly used extrapolation method modelling the long-range forces using a simple power law. By examining the behaviour of the fitting method in the case of two radically different interaction potentials we show that significant uncertainties in the final extracted forces may result from use of the extrapolation method.

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