Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions

2013 ◽  
Vol 87 (11) ◽  
Author(s):  
J. Falter ◽  
G. Langewisch ◽  
H. Hölscher ◽  
H. Fuchs ◽  
A. Schirmeisen
Keyword(s):  
Atomic Force Microscopy ◽  
Long Range ◽  
Field Ion Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ion Microscopy ◽  
Range Force

On Direct Measurement of Forces Between CMP Polishing Pads and Abrasive Nanoparticles

2005 ◽  
Author(s):  
I. Sokolov ◽  
Q. K. Ong ◽  
N. Chechik ◽  
D. James
Keyword(s):  
Atomic Force Microscopy ◽  
Aqueous Solutions ◽  
Long Range ◽  
Direct Measurement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Direct Measurements ◽  
Polishing Pads ◽  
Range Force

The forces of interaction between ceria slurry particles, and polyurethane CMP polishing pads were measured by atomic force microscopy. To measure the forces between the ceria particles and the pads with the AFM, we attached the ceria particles to the AFM tip with epoxy. Attachment of large balls to the AFM tip has been reported before, as well as functionalizing the tip surface with various molecules. Here we report the first successful attachment of nanosize (∼50–100nm) particles to the AFM tip and the direct measurements of forces using such tips. Specifically, we report study of adhesion and long-range force between nanosize ceria particles and three different polyurethane polishing pads. The forces were measured in aqueous solutions of different pH’s ranging from 4 to 9.

Extending the limits of direct force measurements: colloidal probes from sub-micron particles

Nanoscale ◽  
2017 ◽  
Vol 9 (27) ◽  
pp. 9491-9501 ◽  
Author(s):  
Nicolas Helfricht ◽  
Andreas Mark ◽  
Livie Dorwling-Carter ◽  
Tomaso Zambelli ◽  
Georg Papastavrou
Keyword(s):  
Atomic Force Microscopy ◽  
Long Range ◽  
External Pressure ◽  
Silica Particles ◽  
Force Measurements ◽  
Force Microscopy ◽  
Small Probe ◽  
Atomic Force ◽  
Long Range Interactions ◽  
Colloidal Probes

Long-range interactions between sub-micron silica particles have been determined by means of a combination of atomic force microscopy (AFM) with nanofluidics, which allows for a temporary immobilization of small probe particles by an external pressure.

scholarly journals Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

2014 ◽  
Vol 5 ◽  
pp. 386-393 ◽  
Author(s):  
Adam Sweetman ◽  
Andrew Stannard
Keyword(s):  
Atomic Force Microscopy ◽  
Long Range ◽  
Density Functional ◽  
Density Functional Theory Calculations ◽  
Extrapolation Method ◽  
Atomic Scale ◽  
Site Specific ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fitting Method

In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift) is often far from trivial. In most cases there is a significant contribution to the total tip–sample force due to non-site-specific van der Waals and electrostatic forces. Typically, the contribution from these forces must be removed before the results of the experiment can be successfully interpreted, often by comparison to density functional theory calculations. In this paper we compare the ‘on-minus-off’ method for extracting site-specific forces to a commonly used extrapolation method modelling the long-range forces using a simple power law. By examining the behaviour of the fitting method in the case of two radically different interaction potentials we show that significant uncertainties in the final extracted forces may result from use of the extrapolation method.

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