Amplitude or frequency modulation-detection in Kelvin probe force microscopy

2003 ◽  
Vol 210 (1-2) ◽  
pp. 84-89 ◽  
Author(s):  
Th Glatzel ◽  
S Sadewasser ◽  
M.Ch Lux-Steiner
Keyword(s):  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Modulation Detection ◽  
Frequency Modulation Detection

Frequency modulation detection atomic force microscopy in the liquid environment

2001 ◽  
Vol 72 (S1) ◽  
pp. S129-S132 ◽  
Author(s):  
S.P. Jarvis ◽  
T. Ishida ◽  
T. Uchihashi ◽  
Y. Nakayama ◽  
H. Tokumoto
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Liquid Environment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modulation Detection ◽  
Frequency Modulation Detection

New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

2009 ◽  
Vol 103 (26) ◽  
Author(s):  
Sascha Sadewasser ◽  
Pavel Jelinek ◽  
Chung-Kai Fang ◽  
Oscar Custance ◽  
Yusaku Yamada ◽  
...  
Keyword(s):  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Resolution ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy

Frequency-modulation Kelvin probe force microscopy under tapping mode operation for surfaces with large protrusions

2020 ◽  
Vol 59 (9) ◽  
pp. 090906
Author(s):  
Tomoki Misaka ◽  
Kentaro Kajimoto ◽  
Kento Araki ◽  
Yoichi Otsuka ◽  
Takuya Matsumoto
Keyword(s):  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Mode Operation

Investigation of the surface potential of TiO2(110) by frequency-modulation Kelvin probe force microscopy

2016 ◽  
Vol 27 (50) ◽  
pp. 505704 ◽  
Author(s):  
Lili Kou ◽  
Yan Jun Li ◽  
Takeshi Kamijyo ◽  
Yoshitaka Naitoh ◽  
Yasuhiro Sugawara
Keyword(s):  
Surface Potential ◽  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy
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