scholarly journals Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy

2011 ◽  
Vol 9 ◽  
pp. 210-214 ◽  
Author(s):  
Masanao Ito ◽  
Yoshihiro Hosokawa ◽  
Ryuji Nishi ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Frequency Modulation ◽  
Local Potential ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4381-4383 ◽  
Author(s):  
Keiichi Umeda ◽  
Kei Kobayashi ◽  
Kenji Ishida ◽  
Shu Hotta ◽  
Hirofumi Yamada ◽  
...  
Keyword(s):  
Surface Potential ◽  
Ultrathin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

2009 ◽  
Vol 103 (26) ◽  
Author(s):  
Sascha Sadewasser ◽  
Pavel Jelinek ◽  
Chung-Kai Fang ◽  
Oscar Custance ◽  
Yusaku Yamada ◽  
...  
Keyword(s):  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Resolution ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy

Contact Potential Measurement of Carbon Nanotube by Kelvin Probe Force Microscopy

2003 ◽  
Vol 42 (Part 1, No. 4B) ◽  
pp. 2449-2452 ◽  
Author(s):  
Chikashi Maeda ◽  
Shigeru Kishimoto ◽  
Takasi Mizutani ◽  
Toshiki Sugai ◽  
Hisanori Shinohara
Keyword(s):  
Carbon Nanotube ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Contact Potential ◽  
Potential Measurement ◽  
Force Microscopy

Frequency-modulation Kelvin probe force microscopy under tapping mode operation for surfaces with large protrusions

2020 ◽  
Vol 59 (9) ◽  
pp. 090906
Author(s):  
Tomoki Misaka ◽  
Kentaro Kajimoto ◽  
Kento Araki ◽  
Yoichi Otsuka ◽  
Takuya Matsumoto
Keyword(s):  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Mode Operation
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