Structure analysis of amorphous Pd75Si25 alloy by electron diffraction and high-resolution electron microscopy

1996 ◽  
Vol 217-218 ◽  
pp. 392-396 ◽  
Author(s):  
Mitsuhide Matsushita ◽  
Yoshibiko Hirotsu ◽  
Tadakatsu Ohkubo ◽  
Tetsuo Oikawa ◽  
Akihiro Makino
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Structure Analysis ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron

Atomic structure of YB56 studied by digital high-resolution electron microscopy and electron diffraction

2001 ◽  
Vol 16 (1) ◽  
pp. 101-107 ◽  
Author(s):  
Takeo Oku ◽  
Jan-Olov Bovin ◽  
Iwami Higashi ◽  
Takaho Tanaka ◽  
Yoshio Ishizawa
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
High Resolution Electron Microscopy ◽  
Charge Coupled Device ◽  
X Ray ◽  
Resolution Electron ◽  
High Resolution Images ◽  
Diffraction Patterns ◽  
Simulated Images

Atomic positions for Y atoms were determined by using high-resolution electron microscopy and electron diffraction. A slow-scan charge-coupled device camera which had high linearity and electron sensitivity was used to record high-resolution images and electron diffraction patterns digitally. Crystallographic image processing was applied for image analysis, which provided more accurate, averaged Y atom positions. In addition, atomic disordering positions in YB56 were detected from the differential images between observed and simulated images based on x-ray data, which were B24 clusters around the Y-holes. The present work indicates that the structure analysis combined with digital high-resolution electron microscopy, electron diffraction, and differential images is useful for the evaluation of atomic positions and disordering in the boron-based crystals.

Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy

2012 ◽  
Vol 1 (5) ◽  
pp. 389-425 ◽  
Author(s):  
Takeo Oku
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Nanostructured Materials ◽  
Structure Analysis ◽  
Incident Beam ◽  
High Resolution Electron Microscopy ◽  
Structure Model ◽  
Resolution Electron ◽  
Correction Technique ◽  
Resolution Imaging

AbstractHigh-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostructured materials such as boride and oxide materials was described and the high-resolution imaging methods were applied to boron nitride nanomaterials such as nanotubes and nanoparticles. An aberration correction technique is also expected as an advanced nanostructure analysis with higher resolution. The HREM image of TlBa2Ca3Cu4O11 was taken with the incident beam parallel to the a axis together with a structure model after image processing.

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