Characterisation of thin film CdS/CdTe solar cells using electron and optical beam induced current

1999 ◽  
Vol 57 (1) ◽  
pp. 61-74 ◽  
Author(s):  
S.A. Galloway ◽  
P.R. Edwards ◽  
K. Durose
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Optical Beam ◽  
Induced Current ◽  
Cdte Solar Cells ◽  
Optical Beam Induced Current

The role of interfaces in thin-film CdTe solar cells

2002 ◽  
Vol 719 ◽  
Author(s):  
M. J. Romero ◽  
T. A. Gessert ◽  
M. M. Al-Jassim ◽  
R. G. Dhere ◽  
D.S. Albin ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Photovoltaic Effect ◽  
Cost Effective ◽  
External Circuit ◽  
Future Cost ◽  
Induced Current ◽  
Cdte Solar Cells ◽  
Electron Beam Induced Current

AbstractThin-film CdTe solar cells are very promising for future cost-effective photovoltaics. The photovoltaic effect in these cells is based on the extraction of photoexcited carriers by the field provided by the CdTe/CdS heterojunction. An additional interface with non-rectifying characteristics is needed to close the external circuit on the other side of the CdTe thin film. Finally, the transport of photoexcited carriers is influenced by the presence of grain boundaries (GBs). In this contribution, we investigate several aspects of these interfaces and their effects on the operation of CdTe solar cells by electron-beam-induced current (EBIC) and cathodoluminescence (CL) measurements.

A New Confocal Scanning Laser MACROscope/Microscope Applied to the Characterization of Solar Cells

1996 ◽  
Vol 426 ◽  
Author(s):  
A. C. Ribes ◽  
S. Damaskinos ◽  
H. F. Tiedje ◽  
A. E. Dixon ◽  
D. E. Brodie ◽  
...  
Keyword(s):  
Quality Control ◽  
Solar Cells ◽  
Optical Beam ◽  
Imaging Method ◽  
Induced Current ◽  
Large Area ◽  
Silicon Devices ◽  
Reflected Light ◽  
Confocal Scanning ◽  
Optical Beam Induced Current

AbstractScanning stage microscopes have traditionally been used to provide high resolution, large area photocurrent mapping of solar cells and detectors. This imaging method, while very useful in the characterization and quality control of solar cells, is unfortunately slow (image acquisition takes several minutes). This paper describes a confocal scanning beam MACROscope-Microscope which can image specimens from 25×25 μm up to 7.5×7.5 cm in size, a zoom factor of 3000, using reflected light, photoluminescence, and optical beam induced current in less than 10s. Resolutions range from 0.25 to 10 μ;m laterally and 0.5 to 300 pm axially depending upon whether microscope or MACROscope mode is used. This instrument can therefore be used to characterize and provide quick and efficient quality control for solar cells and detectors at a microscopic and macroscopic level.A brief description of the MACROscope-Microscope is given. The MACROscope- Microscope's many abilities are highlighted by showing various reflected-light, photolhminescence and optical beam induced current images from CdZnS/CulnSe2 thin film solar cells and porous silicon devices.

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