Nanometer scale studies of defects in semiconductor films by near-field optical beam induced current (NOBIC)
2017 ◽
pp. 27-36
Keyword(s):
2015 ◽
Vol 821-823
◽
pp. 223-228
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Keyword(s):
1991 ◽
Vol 38-41
◽
pp. 1289-1294
1994 ◽
Vol 33
(Part 1, No. 6A)
◽
pp. 3393-3401
◽
Keyword(s):