Characterization of copper ion sensing thiacalix[4]arene films evaporated on semiconductor substrates
2001 ◽
Vol 14
(1-2)
◽
pp. 17-23
◽
2018 ◽
Vol 186
(1)
◽
pp. 32-39
◽
Keyword(s):
2020 ◽
Vol 154
◽
pp. 104681
◽
1997 ◽
Vol 101
(8)
◽
pp. 1312-1316
◽
2018 ◽
Vol 34
(4)
◽
pp. 395-395
◽
Keyword(s):
Keyword(s):
2007 ◽
Vol 316
(2)
◽
pp. 221-224
◽
Keyword(s):