The electrical potential difference across cracks in PZT measured by Kelvin Probe Microscopy and the implications for fracture

2003 ◽  
Vol 51 (8) ◽  
pp. 2235-2241 ◽  
Author(s):  
G.A. Schneider ◽  
F. Felten ◽  
R.M. McMeeking
Keyword(s):  
Electrical Potential ◽  
Potential Difference ◽  
Electrical Potential Difference ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy

Scanning Kelvin Probe Microscopy of CdTe Solar Cells Measured Under Different Bias Conditions

2009 ◽  
Vol 1165 ◽  
Author(s):  
Helio Moutinho ◽  
Ramesh Dhere ◽  
Chun-Sheng Jiang ◽  
Mowafak Al-Jassim
Keyword(s):  
Electric Field ◽  
Cross Sections ◽  
Electrical Potential ◽  
Kelvin Probe ◽  
Electrical Measurements ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Cdte Solar Cells ◽  
Gaas Substrates ◽  
Scanning Kelvin Probe

AbstractWe have investigated different methods for preparing CdTe/CdS cross sections for electrical measurements, including the following: cleaving; using GaAs substrates; and sandwiching the structure between the substrate and a glass slide, and polishing with diamond discs and alumina suspension. The latter method proved to be the most reliable, with a success rate of over 90%.We investigated cross sections of CdTe/CdS samples with scanning Kelvin probe microscopy (SKPM) using two different methods: applying the alternate bias with a frequency equal to 18.5 kHz, or equal to the frequency of the second cantilever resonance peak. The results showed that using the second resonance frequency produced a smoother signal, allowing the calculation of the electric field inside the device using just the raw SKPM data.We were able to measure the distribution of the electrical potential inside working devices. Then, by taking the first derivative of the potential, we calculated the electric field and determined the location of the p-n junction.

Conception of the Kelvin Method on the Basis of a Mechanic-Electrical Transformation

2018 ◽  
Vol 63 (3) ◽  
pp. 269
Author(s):  
Yu. S. Zharkikh ◽  
S. V. Lysochenko
Keyword(s):  
Mechanical Energy ◽  
Contact Potential Difference ◽  
Electrical Potential ◽  
Potential Difference ◽  
Atomic Scale ◽  
Measured Signal ◽  
Electrical Potential Difference ◽  
Kelvin Probe ◽  
Contact Potential ◽  
Electrostatic Charges

The Kelvin method was based on the concept of the dynamic capacitor recharging by a contact potential difference. The present paper draws attention to the fact that the contact potential difference is not the same physical agent as the electrical potential difference due to the electromotive force. It cannot act as an active electrical voltage and, accordingly, cause the flow of an electric recharging current. The real reason for the appearance of a measured signal is the transformation of the electrode movement mechanical energy into the electric current energy. The current is generated due to periodic changes in the screening conditions of electrostatic charges above the investigated surface. Investigations are made of the method sensitivity to the amount of charges on the sample surface. It is shown that the measurement results are interpreted without invoking the ideas of the work function. Therefore, the method can besuccessfully used in studies of organic and biological materials and electrolytes. The proposed mechanism is applicable in both the investigations of macroscopic distributions of the surfacecharge and the atomic scale in the Kelvin probe force microscopy.

Measurement of built-in electrical potential in III–V solar cells by scanning Kelvin probe microscopy

2003 ◽  
Vol 93 (12) ◽  
pp. 10035-10040 ◽  
Author(s):  
Chun-Sheng Jiang ◽  
H. R. Moutinho ◽  
D. J. Friedman ◽  
J. F. Geisz ◽  
M. M. Al-Jassim
Keyword(s):  
Solar Cells ◽  
Electrical Potential ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe

Kelvin Probe Microscopy of Localized Electric Potentials Induced in Insulating Materials by Electron Irradiation

2004 ◽  
Vol 10 (6) ◽  
pp. 797-803 ◽  
Author(s):  
Marion A. Stevens-Kalceff
Keyword(s):  
Electrical Potential ◽  
Beam Irradiation ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Microscopy Technique ◽  
Atomic Force ◽  
Charged Beam ◽  
Induced Defects ◽  
Trapped Charge

Kelvin probe microscopy (KPM) is a specialized atomic force microscopy technique in which long-range Coulomb forces between a conductive atomic force probe and a specimen enable the electrical potential at the surface of a specimen to be characterized with high spatial resolution. KPM has been used to characterize nonconductive materials following their exposure to stationary electron beam irradiation in a scanning electron microscope (SEM). Charged beam irradiation of poorly conducting materials results in the trapping of charge at either preexisting or irradiation-induced defects. The reproducible characteristic surface potentials associated with the trapped charge have been mapped using KPM. Potential profiles are calculated and compared with observed potential profiles giving insight into the charging processes and residual trapped charge distributions.

Polarization Effects in Graded AlGaN Nanolayers Revealed by Current-Sensing and Kelvin Probe Microscopy

2018 ◽  
Vol 10 (7) ◽  
pp. 6755-6763 ◽  
Author(s):  
Petro M. Lytvyn ◽  
Andrian V. Kuchuk ◽  
Yuriy I. Mazur ◽  
Chen Li ◽  
Morgan E. Ware ◽  
...  
Keyword(s):  
Kelvin Probe ◽  
Current Sensing ◽  
Polarization Effects ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy

Determination of the Physical Properties of Oil Sands Components using Scanning Probe Microscopy

2015 ◽  
Vol 1754 ◽  
pp. 69-74
Author(s):  
Ravi Gaikwad ◽  
Tinu Abraham ◽  
Aharnish Hande ◽  
Fatemeh Bakhtiari ◽  
Siddhartha Das ◽  
...  
Keyword(s):  
Oil Sands ◽  
Structural Changes ◽  
Rational Approach ◽  
Kelvin Probe ◽  
Scanning Calorimetry ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTAtomic force microscopy is employed to study the structural changes in the morphology and physical characteristics of asphaltene aggregates as a function of temperature. The exotic fractal structure obtained by evaporation-driven asphaltene aggregates shows an interesting dynamics for a large range of temperatures from 25°C to 80°C. The changes in the topography, surface potential and adhesion are unnoticeable until 70°C. However, a significant change in the dynamics and material properties is displayed in the range of 70°C - 80°C, during which the aspahltene aggregates acquire ‘liquid-like’ mobility and fuse together. This behaviour is attributed to the transition from the pure amorphous phase to a crystalline liquid phase which occurs at approximately 70°C as shown by using Differential Scanning Calorimetry (DSC). Additionally, the charged nature of asphaltenes and bitumen is also explored using kelvin probe microscopy. Such observations can lead to the development of a rational approach to the fundamental understanding of asphaltene aggregation dynamics and may help in devising novel techniques for the handling and separation of asphaltene aggregates using dielectrophoretic methods.

Sign in / Sign up

Export Citation Format

Share Document