scholarly journals Single electron effects

2003 ◽  
Vol 6 (3) ◽  
pp. 12
2001 ◽  
Vol 40 (Part 1, No. 2A) ◽  
pp. 447-451 ◽  
Author(s):  
Ilgweon Kim ◽  
Sangyeon Han ◽  
Kwangseok Han ◽  
Jongho Lee ◽  
Hyungcheol Shin

1998 ◽  
Vol 09 (01) ◽  
pp. 165-207 ◽  
Author(s):  
DORAN D. SMITH

In the mid 1980s Averin and Likharev predicted that with the use of ultrasmall tunnel junctions a time correlation of electron flow through a junction could be observed, and permit the measurement of the effect of a net charge of less than one electron on the junction. Both effects were soon experimentally verified, and since that time there has been an explosion of work in the filed of single electron devices. This chapter reviews the fundamental concepts behind the operation of such devices. it then describes some of the single electron effects studied in semiconductors. Superconducting devices are then constrasted to the semiconductor and the normal metal single electron devices. The details of some current applications are described, and a thumbnail sketch of current fabrication methods is given.


Author(s):  
Takuya Kaizawa ◽  
Mingyu Jo ◽  
Masashi Arita ◽  
Akira Fujiwara ◽  
Kenji Yamazaki ◽  
...  

A highly functional Si nanodot array device that operates by means of single-electron effects was experimentally demonstrated. The device features many input gates, and many outputs can be attached. A nanodot array device with three input gates and two output terminals was fabricated on a silicon-on-insulator wafer using conventional Si MOS processes. Its feasibility was demonstrated by its operation as both a half adder and a full adder when the operation voltage was carefully selected.


2005 ◽  
Vol 87 (18) ◽  
pp. 182106 ◽  
Author(s):  
C. Pace ◽  
F. Crupi ◽  
S. Lombardo ◽  
C. Gerardi ◽  
G. Cocorullo

2004 ◽  
Vol 69 (24) ◽  
Author(s):  
L. Meier ◽  
A. Fuhrer ◽  
T. Ihn ◽  
K. Ensslin ◽  
W. Wegscheider ◽  
...  

1998 ◽  
Vol 73 (14) ◽  
pp. 1982-1984 ◽  
Author(s):  
T. Schmidt ◽  
R. J. Haug ◽  
K. v. Klitzing ◽  
K. Eberl

Author(s):  
A. S. Dzurak ◽  
M. Field ◽  
J. E. F. Frost ◽  
I. M. Castleton ◽  
C. G. Smith ◽  
...  

1998 ◽  
Vol 73 (8) ◽  
pp. 1113-1115 ◽  
Author(s):  
Andrew C. Irvine ◽  
Zahid A. K. Durrani ◽  
Haroon Ahmed ◽  
Serge Biesemans

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