Characterization of alkali treated flax fibres by means of FT Raman spectroscopy and environmental scanning electron microscopy

2002 ◽  
Vol 58 (10) ◽  
pp. 2271-2279 ◽  
Author(s):  
A Jähn ◽  
M.W Schröder ◽  
M Füting ◽  
K Schenzel ◽  
W Diepenbrock
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Raman Spectroscopy ◽  
Environmental Scanning Electron Microscopy ◽  
Environmental Scanning ◽  
Flax Fibres ◽  
Ft Raman Spectroscopy ◽  
Scanning Electron ◽  
Ft Raman

Characterization of Thin Polymer Blend Films using ESEM – No Charging, No Staining.

2001 ◽  
Vol 707 ◽  
Author(s):  
Ian C. Bache ◽  
Catherine M. Ramsdale ◽  
D. Steve Thomas ◽  
Ana-Claudia Arias ◽  
J. Devin MacKenzie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Environmental Scanning Electron Microscopy ◽  
Environmental Scanning ◽  
Cross Sectional ◽  
Blend Films ◽  
Thin Polymer ◽  
Device Applications ◽  
Scanning Electron

ABSTRACTCharacterising the morphology of thin films for use in device applications requires the ability to study both the structure within the plane of the film, and also through its thickness. Environmental scanning electron microscopy has proved to be a fruitful technique for the study of such films both because contrast can be seen within the film without the need for staining (as is conventionally done for electron microscopy), and because cross-sectional images can be obtained without charging artefacts. The application of ESEM to a particular blend of relevance to photovoltaics is described.

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