Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods
1998 ◽
Vol 2
(1-4)
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pp. 789-793
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Keyword(s):
2005 ◽
Vol 66
(1)
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pp. 81-90
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1991 ◽
pp. 1-8
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2012 ◽
Vol 190
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pp. 24-28
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