Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods

1998 ◽  
Vol 2 (1-4) ◽  
pp. 789-793 ◽  
Author(s):  
A.A Darhuber ◽  
V Holy ◽  
P Schittenhelm ◽  
J Stangl ◽  
I Kegel ◽  
...  
Keyword(s):  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

scholarly journals Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

1997 ◽  
Vol 306 (2) ◽  
pp. 198-204 ◽  
Author(s):  
A.A. Darhuber ◽  
J. Stangl ◽  
V. Holy ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

2008 ◽  
Vol 516 (22) ◽  
pp. 8022-8028 ◽  
Author(s):  
V. Holý ◽  
K. Mundboth ◽  
C. Mokuta ◽  
T.H. Metzger ◽  
J. Stangl ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

Structural characterization of the CeO2/Gd2O3 mixed system by synchrotron X-ray diffraction

2012 ◽  
Vol 190 ◽  
pp. 24-28 ◽  
Author(s):  
Cristina Artini ◽  
Giorgio A. Costa ◽  
Marcella Pani ◽  
Andrea Lausi ◽  
Jasper Plaisier
Keyword(s):  
Structural Characterization ◽  
Mixed System ◽  
X Ray Diffraction ◽  
X Ray
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