Epizoic foraminifera on Nephrops norvegicus

1977 ◽  
Vol 57 (3) ◽  
pp. 877-878 ◽  
Author(s):  
A. S. D. Farmer
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Carapace Length ◽  
Mature Male ◽  
Nephrops Norvegicus ◽  
Anatomical Studies ◽  
Norway Lobster ◽  
Prepared Material ◽  
Inner Surface ◽  
Scanning Electron

During studies in 1972 on the setation and development of the secondary sexual characters of the Norway lobster, Nephrops norvegicus (L., 1758), Foraminifera were observed attached to the pleopods of a mature male (carapace length 2.47 cm). On subsequent examination of the prepared material with a scanning electron microscope it was found that the Foraminifera were attached to one of the first pair of pleopods. Three individuals were observed, all of which were attached to the same pleopod on the inner surface near the tip. No further specimens of Foraminifera were encountered during detailed anatomical studies of more than 30 specimens of N. norvegicus.

Helical Thickenings in Normal and Compression Wood of Some Softwoods

IAWA Journal ◽  
1985 ◽  
Vol 6 (2) ◽  
pp. 131-138 ◽  
Author(s):  
Nobuo Yoshizawa ◽  
Takao Itoh ◽  
Ken Shimaji
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Secondary Wall ◽  
Compression Wood ◽  
Normal Wood ◽  
Additional Layer ◽  
Innermost Layer ◽  
Inner Surface ◽  
Helical Thickenings ◽  
Scanning Electron

Compression wood in some softwoods having helical thickenings on the inner surface of normal wood tracheids were examined using a scanning electron microscope. Helical thickenings of Taxus, Torreya and Cephalotaxus have narrow bases, and are loosely attached to the innermost layer of the secondary wall, while those of Pseudotsuga, Picea and Larix have broad bases blended tightly with the microfibrils of the S3 layer in normal wood. The transition from normal to compression wood entails a preservation of the thickenings in Taxus, Torreya and Cephalotaxus, while they are replaced by helical ridges and cavities in Pseudotsuga, Picea and Larix. The direction of helical thickenings gradually changes from an S- to a Z-helix, or a Z- to an S-helix in the course of the transition from normal to compression wood, or vice versa in Taxus, Torreya and Cephalotaxus. Helical checks never occur in these species. In Pseudotsuga, however, helical thickenings can be deposited as an additional layer on the helical ridges. The results obtained in the present investigation revealed that the orientation of the thickenings did not always coincide with that of the innermost microfibrils of the secondary wall layers, indicating that helical thickenings may be considered as a layer independent of the secondary wall.

Ultrastructure and cytology of pycnia, aecia, and aeciospores of Gymnosporangium clavipes

1975 ◽  
Vol 53 (10) ◽  
pp. 972-977 ◽  
Author(s):  
Frank Kozar ◽  
Hans J. Netolitzky
Keyword(s):  
Cell Wall ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Electron Micrographs ◽  
Transmission Electron Micrographs ◽  
Dense Cytoplasm ◽  
Transmission Electron ◽  
Inner Surface ◽  
Scanning Electron

Aeciospores of Gymnosporangium clavipes Cooke & Peck have a surface characterized by a dense covering of baculate projections. Transmission electron micrographs (TEM) reveal a thick non-striated cell wall and a dense cytoplasm. Peridial cells have an inner surface studded with clavate projections. Scanning electron microscope (SEM) microgaphs confirmed earlier light microscopy studies of the existence of fiexious hyphae.

scholarly journals Anatomical and nutlet differentiation between Teucrium montanum and T. polium from Turkey

Biologia ◽  
2011 ◽  
Vol 66 (3) ◽  
Author(s):  
Muhittin Dınç ◽  
Süleyman Doğu ◽  
Aslı Koca ◽  
Baştürk Kaya
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Stem Anatomy ◽  
Anatomical Studies ◽  
Anatomical Features ◽  
The Family ◽  
Anatomical Characters ◽  
Trichome Morphology ◽  
Scanning Electron

AbstractTeucrium montanum L. and T. polium L. are the two closest Teucrium L. species from sect. Polium (Mill.) Schreb in Turkey. In addition, they are sympatric for some part of their range in Turkey. In this study, comparative anatomical and micromorphological studies of the two species are carried out. They have been investigated by their leaf and stem anatomical features, as well as nutlet micromorphological characteristics. The results of anatomical studies show that the anatomical characters of both taxa are observed to be similar to the general features of the family Lamiaceae anatomy, except for lacking rich collenchyma at the corners. Both taxa are similar in stem anatomy and their leaves exhibit xeromorphy. However, trichome morphology on the stems and the leaves appear to have a taxonomic value in segregation of the two taxa. Light and scanning electron microscope studies on the nutlets also show that nutlet shapes, measures and surface micromorphologies are different in the two species. Whereas nutlet surfaces are bireticulate in both species, the nutlets are larger and primary sculpturing is more distinct in T. polium than in T. montanum. Moreover, the nutlets are oblong to oblong-ovoid and larger in T. polium, but ovoid and smaller in T. montanum.

Inner surface sculpture patterns of cuticles in Cupressaceae

1983 ◽  
Vol 61 (4) ◽  
pp. 1222-1231 ◽  
Author(s):  
F. A. Oladele
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Taxonomic Significance ◽  
Generic Level ◽  
Surface Sculpture ◽  
The Family ◽  
Inner Surface ◽  
Micromorphological Characters ◽  
Scanning Electron

Chemically and enzymatically isolated cuticles in the family Cupressaceae were examined with a scanning electron microscope (SEM). The inner surface of the cuticles has many micromorphological characters which show interspecific and intergeneric variations. Those above the generic level are less apparent. Taxonomic significance of the sculpture patterns is discussed.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

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