Differential Averaging of Single Molecule Images using Multivariate Statistical Classification

1982 ◽  
Vol 40 ◽  
pp. 706-709
Author(s):  
Joachim Frank
Keyword(s):  
Electron Microscope ◽  
Single Molecule ◽  
Negative Staining ◽  
New Technique ◽  
Statistical Classification ◽  
Multivariate Statistical ◽  
Local Averaging ◽  
Resolution Level ◽  
A New Technique ◽  
Range Of Variation

It has been shown that averaging of single molecules or molecular assemblies visualized in the electron microscope is capable of giving reproducible results at the resolution level allowed by negative staining. The resolution achieved for a given specimen is, however, dependent upon the range of variation that the molecule exhibits in the electron microscope (fig. 1). A new technique, differential or local averaging, promises to overcome this limitation in fully utilizing the information contained in the experimental images.

scholarly journals A technique for viewing the same nannofossil specimen in light microscope and scanning electron microscope using standard preparation materials

1988 ◽  
Vol 7 (1) ◽  
pp. 53-57 ◽  
Author(s):  
Liam T. Gallagher
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscope ◽  
New Technique ◽  
Standard Preparation ◽  
A New Technique ◽  
Scanning Electron

Abstract. A new technique for viewing the same nannofossil specimen under the light microscope and scanning electron microscope is described, in which standard preparation materials are used. The applications of this, and previous techniques, are discussed as well as the relevance of these to the elucidation of taxonomic problems.

A New Technique to Produce Clean and Thin Silicon FilmsIn Situin a UHV Electron Microscope for TEM-TED Studies of Surfaces

1990 ◽  
Vol 29 (Part 2, No. 4) ◽  
pp. L655-L658 ◽  
Author(s):  
Soh-ichiro Ozawa ◽  
Akira Yamanaka ◽  
Kunio Kobayashi ◽  
Yasumasa Tanishiro ◽  
Katsumichi Yagi
Keyword(s):  
Electron Microscope ◽  
New Technique ◽  
Thin Silicon ◽  
A New Technique

A New Method of Studying the Performance of Grinding Wheels

1980 ◽  
Vol 102 (1) ◽  
pp. 80-84 ◽  
Author(s):  
K. V. Kumar ◽  
M. Cozminca ◽  
Y. Tanaka ◽  
M. C. Shaw
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
New Method ◽  
New Technique ◽  
Effective Number ◽  
Grinding Wheels ◽  
Abrasive Grains ◽  
Abrasive Tools ◽  
A New Technique ◽  
Scanning Electron

A new technique for studying the performance of abrasive tools is described that is not only useful for evaluating the rate of wear of grinding systems but is also capable of yielding difficult to obtain data (such as the effective number of cutting points and local wheel work deflection) essential in fundamental studies of grinding. The new method involves overcut fly cutting with a small (1/8 in × 1/8 in) cluster of abrasive grains that are normally bound together and dressed. The small size of the specimen is particularly important relative to wear studies in that it enables wear data to be obtained with a relatively small amount of grinding and also permits the used abrasive to be studied in the scanning electron microscope.

Energy loss magnetic chiral dichroism: A new technique for the study of magnetic properties in the electron microscope (invited)

2008 ◽  
Vol 103 (7) ◽  
pp. 07D931 ◽  
Author(s):  
P. Schattschneider ◽  
S. Rubino ◽  
M. Stoeger-Pollach ◽  
C. Hébert ◽  
J. Rusz ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Electron Microscope ◽  
Energy Loss ◽  
New Technique ◽  
A New Technique
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