A new technique for the examination of fatigue striations with the scanning electron microscope

Metallography ◽  
1973 ◽  
Vol 6 (2) ◽  
pp. 176-182
Author(s):  
M. Sarracino
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
New Technique ◽  
Fatigue Striations ◽  
A New Technique ◽  
Scanning Electron

scholarly journals A technique for viewing the same nannofossil specimen in light microscope and scanning electron microscope using standard preparation materials

1988 ◽  
Vol 7 (1) ◽  
pp. 53-57 ◽  
Author(s):  
Liam T. Gallagher
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscope ◽  
New Technique ◽  
Standard Preparation ◽  
A New Technique ◽  
Scanning Electron

Abstract. A new technique for viewing the same nannofossil specimen under the light microscope and scanning electron microscope is described, in which standard preparation materials are used. The applications of this, and previous techniques, are discussed as well as the relevance of these to the elucidation of taxonomic problems.

A New Method of Studying the Performance of Grinding Wheels

1980 ◽  
Vol 102 (1) ◽  
pp. 80-84 ◽  
Author(s):  
K. V. Kumar ◽  
M. Cozminca ◽  
Y. Tanaka ◽  
M. C. Shaw
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
New Method ◽  
New Technique ◽  
Effective Number ◽  
Grinding Wheels ◽  
Abrasive Grains ◽  
Abrasive Tools ◽  
A New Technique ◽  
Scanning Electron

A new technique for studying the performance of abrasive tools is described that is not only useful for evaluating the rate of wear of grinding systems but is also capable of yielding difficult to obtain data (such as the effective number of cutting points and local wheel work deflection) essential in fundamental studies of grinding. The new method involves overcut fly cutting with a small (1/8 in × 1/8 in) cluster of abrasive grains that are normally bound together and dressed. The small size of the specimen is particularly important relative to wear studies in that it enables wear data to be obtained with a relatively small amount of grinding and also permits the used abrasive to be studied in the scanning electron microscope.

A new technique for measuring the local nitrogen concentration in Gap by means of the scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 142-143
Author(s):  
Yu.A. Golubev ◽  
V.V. Evstropov ◽  
B.N. Kalinin ◽  
V.P. Lejnin ◽  
V.I. Petrov
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Nitrogen Doping ◽  
Doping Concentration ◽  
High Spatial Resolution ◽  
Nitrogen Concentration ◽  
Doping Profile ◽  
Luminescence Spectra ◽  
A New Technique ◽  
Scanning Electron

The nuclear reaction and optical absorption techniques have been developed to determine the absolute nitrogen doping concentration in GaP crystals/1/.In both cases the data measured are averaged over the doped layer and these methods do not permit to obtain the nitrogen doping profile across the layer.In this work the measurement of the nitrogen concentration in GaP LED structures is carried out with high spatial resolution by using the local cathodoluminescence (CL) data obtained in the scanning electron microscope (SEM).The method is based on determining in CL spectra the degree of the A-line self-absorption by substitutional nitrogen in GaP crystal.lt has been shown recently /2/ that in the temperature range of 77°K - 130°K without self-absorption the peak intensities ratio of A-line and its phonon replication side bands A-LO and A-2L0 in luminescence spectra of GaP should correspond to 1,00 : 0,36 : 0,065.

The Preparation and Micro Mechanism of Brick Materials with Iron Tailings in Tanshang Area

2013 ◽  
Vol 753-755 ◽  
pp. 572-575
Author(s):  
Shu Xian Liu ◽  
Shao Bo Wei
Keyword(s):  
Compressive Strength ◽  
Electron Microscope ◽  
Fly Ash ◽  
Flexural Strength ◽  
Scanning Electron Microscope ◽  
Steam Curing ◽  
X Ray ◽  
A New Technique ◽  
Scanning Electron

This paper discussed the experimental results of exploiting brick materials with iron tailing materials in Tanshang area. Through preparation of iron tailing bricks, the technical flow and production proportion was obtained. The results show that a burning-and steam curing-free brick product with a compressive strength of 28.30 MPa and Flexural strength of 5.63 MPa as the following: iron tailing; fly ash; sand; CaO; gypsum; cement. And long-term properties of a burning-and steam curing-free brick is also studied by experiments in this paper. Put forward a new technique of making materials with iron tailing. At the same time, the micro mechanism of iron tailing brick was also studied with X-Ray Diffractometer (XRD) and Scanning Electron Microscope (SEM).

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

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