The preparation and study of a holey polymer film

1987 ◽  
Vol 45 ◽  
pp. 644-645
Author(s):  
Phillip K. Vinson
Keyword(s):  
Electrical Conductivity ◽  
Polymer Film ◽  
Carbon Coating ◽  
Mechanical Stability ◽  
Continuous Film ◽  
Thin Specimen ◽  
Liquid Samples ◽  
Tem Grid

A holey carbon grid (HCG) consists of a TEM grid with a holey polymer film (HPF) attached to its surface and a carbon coating to provide mechanical stability and electrical conductivity. HCGs have found wide use in the preparation of liquid samples for cryo-TEM. These grids increase the number of sample sites by as much as three orders of magnitude and aid in the formation of fairly uniform, thin specimen films (< 250 nm). Several methods have been reported for the production of HPFs for specimen support. Unfortunately, most methods are unreliable, often producing films with pseudo-holes and large continuous film regions. Essential to improving any technique is an understanding of the process mechanisms involved. This paper describes a technique, modified from Refs. 1 and 2, for preparing HPFs and suggests a drying mechanism to explain the results.

A transparent embedded Cu/Au-nanomesh electrode on flexible polymer film substrates

RSC Advances ◽  
2016 ◽  
Vol 6 (95) ◽  
pp. 92970-92974 ◽  
Author(s):  
Pil-Hoon Jung ◽  
Yang Doo Kim ◽  
Hak-Jong Choi ◽  
Young Hoon Sung ◽  
Heon Lee
Keyword(s):  
Electrical Conductivity ◽  
Mechanical Strength ◽  
Polymer Film ◽  
Oxidation Resistance ◽  
Transparent Electrodes ◽  
Flexible Polymer ◽  
Embedded Structure ◽  
Flexible Transparent Electrodes

We report transparent embedded Cu/Au-nanomesh electrodes with high transmittance and electrical conductivity. Their embedded structure also endows these flexible transparent electrodes with oxidation resistance and good mechanical strength.

Evaporation induced nanoparticle – binder interaction in electrode film formation

2017 ◽  
Vol 19 (15) ◽  
pp. 10051-10061 ◽  
Author(s):  
Zhixiao Liu ◽  
David L. Wood ◽  
Partha P. Mukherjee
Keyword(s):  
Electrical Conductivity ◽  
Mechanical Stability ◽  
Film Formation ◽  
Drying Temperature

Low drying temperature and longer chain binders are preferred to produce electrode films with good electrical conductivity and mechanical stability.

Recent Developments in the use of the Tripod Polisher for TEM Specimen Preparation

1991 ◽  
Vol 254 ◽  
Author(s):  
John Benedict ◽  
Ron Anderson ◽  
Stanley J. Klepeis
Keyword(s):  
Cross Sections ◽  
Colloidal Silica ◽  
Mechanical Stability ◽  
Semiconductor Industry ◽  
Polished Surface ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Thin Specimen ◽  
Tem Analysis ◽  
Area Of Interest

AbstractCross sections of material specimens for TEM analysis must be produced in the shortest time possible, contain few, if any, artifacts and have a large area available for analysis. The analyst must also be able to prepare these cross sections from specified areas of complex, heterogeneous structures on a routine, reproducible basis to meet the growing needs of the semiconductor industry for TEM analysis. The specimen preparation spatial resolution required for preparing precision cross sections is substantially less than one micron. Cross sections meeting these requirements can be prepared by mounting a specimen to the Tripod Polisher and mechanically polishing on one side of the specimen, using a sequence of progressively finer grit diamond lapping films, until the area of interest is reached. This polished surface is then very briefly polished on a cloth wheel with colloidal silica to attain the final polish on that side. The specimen is then flipped over on the Tripod Polisher and polished from the other side, using same sequence of diamond lapping films to reach the predefined area of interest. The Tripod Polisher is set at a slight angle, to produce a tapered, wedge-shaped specimen, which has the area of interest at the thinnest edge of the taper. The specimen is polished with the diamond lapping films and the colloidal silica until it is 1000 Angstroms or less in thickness. The specimen is removed from the polisher and mounted on a 2 × 1mm slotted grid with M-Bond 610 epoxy. After the epoxy is cured the specimen can be taken directly to the microscope for analysis. The need for ion milling has been eliminated or reduced to a few minutes in most of our work because of the thinness of the final specimen. The total specimen preparation time is between 2.5 and 4 hours, depending on the specimen and the size of the specified area. The area available for analysis ranges from 0.5mm up to the full size of the mounting grid opening. The wedge shape of the specimen provides the mechanical stability needed for a long thin specimen.

An Interlinked Computational-Experimental Investigation into SnS Nano-Flakes for Field Emission Application

2021 ◽  
Author(s):  
Mamta P. Nasane ◽  
Sachin R. Rondiya ◽  
Chandradip D. Jadhav ◽  
Ganesh Rahane ◽  
Russell William Cross ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Experimental Investigation ◽  
Work Function ◽  
Field Emission ◽  
Mechanical Stability ◽  
Semiconductor Materials ◽  
Field Emitters ◽  
Significant Interest

Layered binary semiconductor materials have attracted significant interest as field emitters due to their low work function, mechanical stability, high thermal and electrical conductivity. Herein, we report a systematic experimental...

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