A Simple Real-Space Channelling Theory for Electron Diffraction and HREM

Author(s):  
D. Van Dyck

The computation of the many beam dynamical electron diffraction amplitudes or high resolution images can only be done numerically by using rather sophisticated computer programs so that the physical insight in the diffraction progress is often lost. Furthermore, it is not likely that in this way the inverse problem can be solved exactly, i.e. to reconstruct the structure of the object from the knowledge of the wavefunction at its exit face, as is needed for a direct method [1]. For this purpose, analytical expressions for the electron wavefunction in real or reciprocal space are much more useful. However, the analytical expressions available at present are relatively poor approximations of the dynamical scattering which are only valid either for thin objects ((weak) phase object approximation, thick phase object approximation, kinematical theory) or when the number of beams is very limited (2 or 3). Both requirements are usually invalid for HREM of crystals. There is a need for an analytical expression of the dynamical electron wavefunction which applies for many beam diffraction in thicker crystals. It is well known that, when a crystal is viewed along a zone axis, i.e. parallel to the atom columns, the high resolution images often show a one-to-one correspondence with the configuration of columns provided the distance between the columns is large enough and the resolution of the instrument is sufficient. This is for instance the case in ordered alloys with a column structure [2,3]. From this, it can be suggested that, for a crystal viewed along a zone axis with sufficient separation between the columns, the wave function at the exit face does mainly depend on the projected structure, i.e. on the type of atom columns. Hence, the classical picture of electrons traversing the crystal as plane-like waves in the directions of the Bragg beams which historically stems from the X-ray diffraction picture, is in fact misleading.


Author(s):  
R. F. Loane ◽  
E. J. Kirkland ◽  
J. Silcox

The multislice algorithm has been used to simulate ADF STEM images. Examination of the evolution of the electron wavefunction as it propagates through the specimen, can provide insight into the sources of contrast in the STEM image. Plots of the wavefunction intensity as a function of position and as a convergent beam electron diffraction (CBED) pattern are two complementary views of the diffraction process. Examples from the large number of these plots that are calculated during the ADF STEM calculations will be presented.The simulated specimen consists of multiples of 47 Å (15 slices) of silicon (111). The slices are 65 Å × 66 Å(512 × 512 pixels) in size, setting the maximum included scattering angle to 95 mrad. The incident probe models a 100 keV VG-HB501 STEM at Scherzer focus with either the low resolution pole piece (Cs=3.3 mm, Δf=1100 Å, αap = 8.2 mrad) or the high resolution pole piece (Cs = 0.7 mm, Δf=510 Å, αap=12.1 mrad). The beam and specimen are aligned exactly along the (111) zone axis (no tilt).



Author(s):  
J. A. Eades

For well over two decades computers have played an important role in electron microscopy; they now pervade the whole field - as indeed they do in so many other aspects of our lives. The initial use of computers was mainly for large (as it seemed then) off-line calculations for image simulations; for example, of dislocation images.Image simulation has continued to be one of the most notable uses of computers particularly since it is essential to the correct interpretation of high resolution images. In microanalysis, too, the computer has had a rather high profile. In this case because it has been a necessary part of the equipment delivered by manufacturers. By contrast the use of computers for electron diffraction analysis has been slow to prominence. This is not to say that there has been no activity, quite the contrary; however it has not had such a great impact on the field.



Author(s):  
B. R. Ahn ◽  
N. J. Kim

High energy approximation in dynamic theory of electron diffraction involves some intrinsic problems. First, the loss of theoretical strictness makes it difficult to comprehend the phenomena of electron diffraction. Secondly, it is difficult to believe that the approximation is reasonable especially in the following cases: 1) when accelerating voltage is not sufficiently high, 2) when the specimen is thick, 3) when the angle between the surface normal of the specimen and zone axis is large, and 4) when diffracted beam with large diffraction angle is included in the calculation. However, until now the method to calculate the many beam dynamic electron diffraction without the high energy approximation has not been proposed. For this reason, the authors propose a method to eliminate the high energy approximation in the calculation of many beam dynamic electron diffraction. In this method, a perfect crystal with flat surface was assumed. The method was applied to the calculation of [111] zone axis CBED patterns of Si.



2001 ◽  
Vol 16 (1) ◽  
pp. 101-107 ◽  
Author(s):  
Takeo Oku ◽  
Jan-Olov Bovin ◽  
Iwami Higashi ◽  
Takaho Tanaka ◽  
Yoshio Ishizawa

Atomic positions for Y atoms were determined by using high-resolution electron microscopy and electron diffraction. A slow-scan charge-coupled device camera which had high linearity and electron sensitivity was used to record high-resolution images and electron diffraction patterns digitally. Crystallographic image processing was applied for image analysis, which provided more accurate, averaged Y atom positions. In addition, atomic disordering positions in YB56 were detected from the differential images between observed and simulated images based on x-ray data, which were B24 clusters around the Y-holes. The present work indicates that the structure analysis combined with digital high-resolution electron microscopy, electron diffraction, and differential images is useful for the evaluation of atomic positions and disordering in the boron-based crystals.



1997 ◽  
Vol 3 (S2) ◽  
pp. 1029-1030
Author(s):  
H.W. Zandbergen

Exit waves can be reconstructed from through focus series of HREM images or by off-axis holography [1]. We have applied the through focus method to reconstruct exit waves, using algorithms developed by Van Dyck and Coene [2]. Electron microscopy was performed with a Philips CM30ST electron microscope with a field emission gun operated at 300 kV. The high resolution images were recorded using a Tietz software package and a 1024x1024 pixel Photometrix CCD camera having a dynamic range of 12 bits. The reconstructions were done using 15-20 images with focus increments of 5.2 nm. The resulting exit waves were corrected posteriorly for the three fold astigmatism.The exit wave is complex; consequently it contains phase and amplitude. Since in the very thin regions the specimen acts as a thin phase object, such a thin area will show little contrast, an example of which is shown in Figure 1.



Author(s):  
Peter G. Self ◽  
Peter R. Buseck

HRTEM images of the [001] zone of rutile (fig. 1) show 0.32 nm fringes near the edge of the crystal, but these rapidly change to 0.46 nm in the thicker parts of the crystal. This change in spacing is only possible if the intensities in the dynamically forbidden {100} reflections become comparable to the intensities of the {110} reflections. The {100} reflections are dynamically forbidden because the structure has 2-fold screw axes parallel to a and b and n-glides perpendicular to a and b. The presence of 0.46 nm rather than 0.32 nm fringe spacings in images of the thicker crystal regions presents a severe problem in matching the images to computer simulations. Fig. 2 shows [001] zone axis images for thin and thick crystals. As expected from symmetry, the computed images show only 0.32 nm spacings. In an attempt to explain the mismatch between computed and experimental images several effects not normally included in image calculations, and which could cause a change in the symmetry of electron diffraction patterns, were investigated, all without success.



2012 ◽  
Vol 186 ◽  
pp. 255-258 ◽  
Author(s):  
Katarzyna Stan ◽  
Lidia Lityńska-Dobrzyńska ◽  
Jan Dutkiewicz ◽  
Lukasz Rogal ◽  
Anna Maria Janus

Microstructure of rapidly solidified Al91Mn7Fe2 (at.%) alloy was investigated using SEM and TEM techniques. Quasicrystalline particles of different shapes and sizes embedded in the aluminium matrix were observed. Quasilattice constant was calculated as 0.461 Å. Additionally orientation relationships between matrix and quasicrystals particles were found based on electron diffraction patterns and high resolution images, such that: five-fold axis lie along [011] or [001] axes of the α-Al crystallographic direction.



2013 ◽  
Vol 4 (6) ◽  
pp. 975-981 ◽  
Author(s):  
Daniel Bahena ◽  
Nabraj Bhattarai ◽  
Ulises Santiago ◽  
Alfredo Tlahuice ◽  
Arturo Ponce ◽  
...  


1989 ◽  
Vol 159 ◽  
Author(s):  
Michael A. O'Keefe ◽  
Ulrich Dahmen ◽  
Crispin J.D. Hetherington

ABSTRACTA “map” of all possible high-resolution images may be simulated for a crystalline specimen in a chosen orientation for any particular transmission electron microscope (HRTEM). These maps are useful during experimental high-resolution electron microscopy and make it possible to locate optimum imaging conditions even for foil thicknesses beyond the weak-phase object limit. Although defects such as grain boundaries are not generally periodic, image maps of perfect crystal can be used to optimize defect contrast during operation of the microscope by reference to the image of the perfect crystal neighboring the defect.



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