The Next Generation of EDS: Microcalorimeter Eds With 3 eV Energy Resolution

1998 ◽  
Vol 4 (S2) ◽  
pp. 172-173
Author(s):  
John M. Martinis ◽  
K. D. Irwin ◽  
D. A. Wollman ◽  
G. C. Hilton ◽  
L. L. Dulcie ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Quantum Interference ◽  
Pulse Shaping ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Adiabatic Demagnetization ◽  
Pile Up ◽  
Channel Analyzer ◽  
Shaping Amplifier

Semiconductor energy dispersive spectrometers (EDS), the most commonly used detectors for x-ray microanalysis, have matured to the point that significant improvement in energy resolution is not expected in the future. We believe a revolutionary advance in x-ray microanalysis will occur in the next few years due to the development of new x-ray spectrometers based on microcalorimeters. Energy resolution comparable with wavelength dispersive spectrometers, 3 eV to 10 eV, has already been achieved; future detectors may reach a fundamental limit as low as 0.5 eV to 1 eV.In a microcalorimeter, the energy of an x-ray is converted into heat, and a measurement of the temperature rise of the detector gives the deposited photon energy. Our microcalorimeter detector consists of a superconducting transition edge thermometer cooled to an operating temperature of 100 mK by a compact adiabatic demagnetization refrigerator, a read-out SQUID (Superconducting Quantum Interference Device) preamplifier followed by pulse-shaping amplifier and pile-up rejection circuitry, and a multi-channel analyzer with real-time computer interface.

scholarly journals A Review of X-ray Microcalorimeters Based on Superconducting Transition Edge Sensors for Astrophysics and Particle Physics

2021 ◽  
Vol 11 (9) ◽  
pp. 3793
Author(s):  
Luciano Gottardi ◽  
Kenichiro Nagayashi
Keyword(s):  
Low Temperature ◽  
Energy Resolution ◽  
Particle Physics ◽  
State Of The Art ◽  
Transition Edge Sensors ◽  
The State ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
The Way

The state-of-the-art technology of X-ray microcalorimeters based on superconducting transition-edge sensors (TESs), for applications in astrophysics and particle physics, is reviewed. We will show the advance in understanding the detector physics and describe the recent breakthroughs in the TES design that are opening the way towards the fabrication and the read-out of very large arrays of pixels with unprecedented energy resolution. The most challenging low temperature instruments for space- and ground-base experiments will be described.

EDS x-ray microcalorimeters with 13 eV energy resolution

1996 ◽  
Vol 54 ◽  
pp. 488-489
Author(s):  
D. A. Wollman ◽  
G. C. Hilton ◽  
K. D. Irwin ◽  
J. M. Martinis
Keyword(s):  
Energy Resolution ◽  
Temperature Rise ◽  
Energy Dispersive Spectroscopy ◽  
Transition Edge Sensor ◽  
Electrical Contact ◽  
Low Energy ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Eds Microanalysis

Although Si- and Ge-based Energy Dispersive Spectroscopy (EDS) detectors are by far the most commonly used x-ray spectrometers for microanalysis, they are limited by energy resolutions on the order of 100 eV. This low energy resolution is insufficient to clearly resolve many peak overlaps between Kα x-ray lines of different elements. In addition, many L and M lines of heavier elements fall in the 100 eV to 2 keV energy range, making it difficult in complicated spectra to identify and quantify the presence of technologically important lighter elements. Higher energy resolution and good count rates are necessary to provide improved limits of detectability.We are developing a cryogenic x-ray microcalorimeter with significantly improved energy resolution and a count rate and detector area suitable for EDS microanalysis. In a calorimeter, the energy of an x-ray is converted to heat, and a measurement of the temperature rise of the detector gives the deposited photon energy. Our microcalorimeter detector consists of a normal-metal x-ray absorber which is in thermal and electrical contact with a superconducting transition-edge sensor (TES).

High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-ray Micro Analysis

1997 ◽  
Vol 3 (S2) ◽  
pp. 1073-1074 ◽  
Author(s):  
D. A. Wollman ◽  
G. C. Hilton ◽  
K. D. Irwin ◽  
L. L. Dulcie ◽  
Dale E. Newbury ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Quantum Interference ◽  
Qualitative Evaluation ◽  
High Energy ◽  
Ease Of Use ◽  
High Energy Resolution ◽  
Superconducting Transition ◽  
Multiple Diffraction ◽  
X Ray ◽  
Excellent Energy Resolution

Si(Li) and Ge Energy Dispersive Spectroscopy (EDS) detectors are commonly used for x-ray microanalysis because they are easy to use, inexpensive to operate, and offer both rapid qualitative evaluation of chemical composition and accurate quantitative analysis. Unfortunately, they are limited by energy resolutions on the order of 100 eV, which is insufficient to resolve many important overlapping x-ray peaks in materials of industrial interest, such as the Si Kα and W Mα peak overlap in WSi2. Although WDS spectrometers with excellent energy resolution (typically 2 eV to 10 eV) can resolve most peak overlaps, qualitative WDS analysis is limited by the need to serially scan over the entire energy range using multiple diffraction crystals. There is a need for a new generation of x-ray spectrometers for microanalysis that combines the excellent energy resolution of WDS spectrometers with the ease of use and the parallel energy detection capability of EDS spectrometers.We are developing a high-energy-resolution x-ray microcalorimeter spectrometer for use in x-ray microanalysis. Our microcalorimeter spectrometer consists of a superconducting transition-edge microcalorimeter cooled to an operating temperature of 100 mK by a compact adiabatic demagnetization refrigerator mounted on a SEM column, read-out SQUID (Superconducting Quantum Interference Device) electronics followed by pulse-shaping amplifiers and pile-up rejection circuitry, and a multichannel analyzer with real-time computer interface.

Fine pitch transition-edge sensor X-ray microcalorimeters with sub-eV energy resolution at 1.5 keV

2015 ◽  
Vol 107 (22) ◽  
pp. 223503 ◽  
Author(s):  
S. J. Lee ◽  
J. S. Adams ◽  
S. R. Bandler ◽  
J. A. Chervenak ◽  
M. E. Eckart ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Transition Edge Sensor ◽  
X Ray ◽  
Fine Pitch ◽  
Transition Edge

scholarly journals X-ray Microcalorimeter Based on Superconducting Transition Edge Sensors

2008 ◽  
Vol 24 (1) ◽  
pp. 11-14 ◽  
Author(s):  
Masashi OHNO ◽  
Hiroyuki TAKAHASHI ◽  
R. M. Thushara DAMAYANTHI ◽  
Yasuhiro MINAMIKAWA ◽  
Fumiakira MORI
Keyword(s):  
Transition Edge Sensors ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge

Phonon-mediated superconducting transition-edge sensor x-ray detectors for use in astronomy

2004 ◽  
Author(s):  
Steven W. Leman ◽  
Dennis S. Martinez-Galarce ◽  
Paul L. Brink ◽  
Blas Cabrera ◽  
Joseph P. Castle ◽  
...  
Keyword(s):  
Transition Edge Sensor ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge

Interfacial And Surface Study Of Mo-Au And Al-Ag Bilayers For Si-Based Photodetectors

1999 ◽  
Vol 5 (S2) ◽  
pp. 164-165
Author(s):  
Mary J. Li ◽  
S. Aslam ◽  
T.C. Chen ◽  
F.M. Finkbeiner ◽  
C. He ◽  
...  
Keyword(s):  
Transition Temperature ◽  
Quantum Interference ◽  
Ultra Violet ◽  
Incident Radiation ◽  
Transition Edge Sensors ◽  
Normal Metal ◽  
Superconducting Transition ◽  
Transition Edge ◽  
Superconductor Film ◽  
Superconducting Metal

Bilayer thin films have been utilized in superconducting transition-edge sensors (TES) for photodetector development. A TES is formed with a normal metal conductor film and a superconductor film, so called bilayer, deposited on a subtract. In its,transition temperature region, the resistance of the superconductor film is extremely sensitive to the temperature. When an incident radiation ray arrives, the temperature of the bilayer increases, leading the resistance increases tremendously. A superconducting quantum interference device measures the current variation for read-out. By varying the relative thickness of the normal metal conductor layer and the superconductor layer, one can adjust the transition temperature of the bilayer to a desired range according to the proximity effect. TES bilayers are fabricated on Si-based substrates for the development of infrared, ultra-violet, and x-ray detectors.Various normal and superconducting metal combinations are considered as bilayer candidates. When two metals are brought together, the concerns usually rise to those materials issues that may affect TES performance.

X‐ray detection using a superconducting transition‐edge sensor microcalorimeter with electrothermal feedback

1996 ◽  
Vol 69 (13) ◽  
pp. 1945-1947 ◽  
Author(s):  
K. D. Irwin ◽  
G. C. Hilton ◽  
D. A. Wollman ◽  
John M. Martinis
Keyword(s):  
Transition Edge Sensor ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge
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