Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
2004 ◽
Vol 10
(S02)
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pp. 820-821
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2003 ◽
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2007 ◽
Vol 19
(45)
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pp. 455205
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2001 ◽
Vol 16
(11)
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pp. 3030-3033
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