Characterization Of The Phase Evolution Of MoSi2/TiB2 Composites Produced By Elemental And Displacement In-Situ Reactions Using Scanning Electron Microscopy (SEM) And Electron Probe Microanalysis (EPMA)
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
2016 ◽
Vol 163
(8)
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pp. A1660-A1665
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2007 ◽
Vol 86
(9)
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pp. 857-861
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