scholarly journals Three-Dimensional Nanoscale Characterization of Pt Deposition from an Organometallic Precursor Induced by a Focused Ion Beam

2006 ◽  
Vol 12 (S02) ◽  
pp. 1252-1253 ◽  
Author(s):  
SA Gerstl ◽  
A Morrone ◽  
R Kvitek
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Organometallic Precursor ◽  
Nanoscale Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Focused ion beam microscope as an analytical tool for nanoscale characterization of gradient-formulated polymeric sensor materials

2005 ◽  
Vol 894 ◽  
Author(s):  
Katharine Dovidenko ◽  
Radislav A. Potyrailo ◽  
Games Grande
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Nano Particles ◽  
Metal Particles ◽  
Nanoscale Characterization ◽  
Sensor Materials ◽  
Metal Nano Particles ◽  
Gradient Approach

AbstractIn this study, we are demonstrating localized nano-scale analysis of sensor materials which are developed using combinatorial gradient approach. Our technique based on Focused Ion Beam cross-sectioning at specific locations affords establishing metal nano-particles concentrations at best-performing area(s) of gradient-formulated polymer samples. We have achieved three-dimensional characterization/mapping of nano-fillers (30-100 nm metal particles) in composite thin films on variety of substrates.

scholarly journals FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials

2019 ◽  
Vol 2019 ◽  
pp. 1-8 ◽  
Author(s):  
Nan Nan ◽  
Jingxin Wang
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
3D Tomography ◽  
Tomography System ◽  
Internal Structures ◽  
Potential Applications ◽  
Scanning Electron ◽  
Carbon Based

A review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based materials were discussed. The goal of this paper is to highlight the advances of FIB-SEM 3D reconstruction to reveal the high and accurate resolution of internal structures of carbon-based materials and provide suggestions for the adoption and improvement of the FIB-SEM tomography system for a broad carbon-based research to achieve the best examination performances and enhance the development of innovative carbon-based materials.

A Direct and Quantitative Three-Dimensional Reconstruction of the Internal Structure of Disordered Mesoporous Carbon with Tailored Pore Size

2013 ◽  
Vol 19 (3) ◽  
pp. 745-750 ◽  
Author(s):  
Juan Balach ◽  
Flavio Soldera ◽  
Diego F. Acevedo ◽  
Frank Mücklich ◽  
César A. Barbero
Keyword(s):  
Pore Size ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Quantitative Characterization ◽  
Resorcinol Formaldehyde ◽  
Dual Beam ◽  
Dimensional Reconstruction ◽  
A New Technique

AbstractA new technique that allows direct three-dimensional (3D) investigations of mesopores in carbon materials and quantitative characterization of their physical properties is reported. Focused ion beam nanotomography (FIB-nt) is performed by a serial sectioning procedure with a dual beam FIB-scanning electron microscopy instrument. Mesoporous carbons (MPCs) with tailored mesopore size are produced by carbonization of resorcinol-formaldehyde gels in the presence of a cationic surfactant as a pore stabilizer. A visual 3D morphology representation of disordered porous carbon is shown. Pore size distribution of MPCs is determined by the FIB-nt technique and nitrogen sorption isotherm methods to compare both results. The obtained MPCs exhibit pore sizes of 4.7, 7.2, and 18.3 nm, and a specific surface area of ca. 560 m2/g.

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM

2014 ◽  
Vol 61 (1) ◽  
pp. 109-120 ◽  
Author(s):  
J. A. Taillon ◽  
C. Pellegrinelli ◽  
Y. Huang ◽  
E. D. Wachsman ◽  
L. G. Salamanca-Riba
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Microstructural Characterization ◽  
Cathode Degradation

scholarly journals Three Dimensional Characterization of Cells in Hydrogel with Focused Ion Beam

2011 ◽  
Vol 17 (S2) ◽  
pp. 692-693
Author(s):  
A Al-Abboodi ◽  
J Fu ◽  
P Chan ◽  
P Doran
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

X-ray nanotomography and focused-ion-beam sectioning for quantitative three-dimensional analysis of nanocomposites

2016 ◽  
Vol 23 (4) ◽  
pp. 990-996 ◽  
Author(s):  
Christopher E. Shuck ◽  
Mathew Frazee ◽  
Andrew Gillman ◽  
Matthew T. Beason ◽  
Ibrahim Emre Gunduz ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Nondestructive Method ◽  
Material Behavior ◽  
Dimensional Structure ◽  
X Ray ◽  
The Monte Carlo Method ◽  
Micrometer Size

Knowing the relationship between three-dimensional structure and properties is paramount for complete understanding of material behavior. In this work, the internal nanostructure of micrometer-size (∼10 µm) composite Ni/Al particles was analyzed using two different approaches. The first technique, synchrotron-based X-ray nanotomography, is a nondestructive method that can attain resolutions of tens of nanometers. The second is a destructive technique with sub-nanometer resolution utilizing scanning electron microscopy combined with an ion beam and `slice and view' analysis, where the sample is repeatedly milled and imaged. The obtained results suggest that both techniques allow for an accurate characterization of the larger-scale structures, while differences exist in the characterization of the smallest features. Using the Monte Carlo method, the effective resolution of the X-ray nanotomography technique was determined to be ∼48 nm, while focused-ion-beam sectioning with `slice and view' analysis was ∼5 nm.

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