Focused Ion Beam as a Nanofabrication Tool for Rapid Prototyping of Nanomagnetic Devices
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
2002 ◽
Vol 97-98
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pp. 208-214
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2008 ◽
Vol 47
(6)
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pp. 5010-5014
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Rapid prototyping of two-dimensional photonic crystal devices by a dual beam focused ion beam system
2005 ◽
Vol 78-79
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pp. 417-421
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