scholarly journals Tomographic Characterization of Dislocations in Failure Regions of Broad Area InGaAs/AlGaAs Strained Layer Single Quantum Well High Power Laser Diodes

2009 ◽  
Vol 15 (S2) ◽  
pp. 598-599
Author(s):  
B Foran ◽  
N Ives ◽  
T Yeoh ◽  
M Brodie ◽  
Y Sin ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

1996 ◽  
Author(s):  
Lijun Wang ◽  
Sheng Li Wu ◽  
Jacqueline E. Diaz ◽  
Ivan Eliashevich ◽  
Hyuk J. Yi ◽  
...  

1997 ◽  
Vol 33 (12) ◽  
pp. 1084 ◽  
Author(s):  
R. Hiroyama ◽  
T. Uetani ◽  
Y. Bessho ◽  
M. Shono ◽  
M. Sawada ◽  
...  

2011 ◽  
Vol 110 (3) ◽  
pp. 033113 ◽  
Author(s):  
A. Martín-Martín ◽  
P. Iñiguez ◽  
J. Jiménez ◽  
M. Oudart ◽  
J. Nagle

2012 ◽  
Vol 5 (6) ◽  
pp. 062101 ◽  
Author(s):  
Sumiko Fujisaki ◽  
Jun-ichi Kasai ◽  
Ryouichi Akimoto ◽  
Shigehisa Tanaka ◽  
Shinji Tsuji ◽  
...  

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