Tomographic Characterization of Dislocations in Failure Regions of Broad Area InGaAs/AlGaAs Strained Layer Single Quantum Well High Power Laser Diodes
Keyword(s):
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
2005 ◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2001 ◽
Vol 80
(1-3)
◽
pp. 87-90
◽
Keyword(s):
1990 ◽
Vol 2
(12)
◽
pp. 849-851
◽