<p>Quantitative modal analysis of rock thin sections or liberation analysis of minerals processing plant materials can be very complex as grain sizes can vary by more than 7 orders of magnitude: Thin sections of rocks may contain extremely coarse grains (mm-sized crystals) down to glassy material with no long-range order (ordered domains <1 nm).</p><p>Material characterisation and modal analysis have traditionally been carried out with a combination of solid-state, microscopic and spectroscopic techniques (e.g., optical / scanning electron microscopy, powder X-ray diffraction, X-ray fluorescence spectroscopy). These techniques require different sample preparation routines, data acquisition and evaluation - a time-consuming process that may be considered too complex to implement in mineral processing plants despite requiring the relevant sample preparation equipment. Scanning electron microscopy (SEM) coupled with energy dispersive spectroscopy (EDS provides an opportunity to carry out this characterisation in a more rigorous and, in certain cases, automated way. This process includes image thresholding (setting of grey levels of present phases by the analyst) and X-ray data collection with EDS. EDS is an ideal analytical technique for this work as it offers high acquisition speeds and the collection of the whole energy spectrum with a single detector, not requiring the selection of a fixed element list prior to data acquisition. Characterisation of coarse-grained rocks requires larger areas to be scanned in order to ensure representativity.</p><p>The analytical workflow can be further optimised by combining SEM-based analytical techniques for in situ, non-destructive, and potentially simultaneous bulk analysis. Electron backscatter diffraction (EBSD) is an SEM-based technique which can be used to determine the crystallographic properties and orientation of mineral grains, as well as to perform fabric analyses on polycrystalline materials. EBSD allows for crystallographic data to be collected simultaneously with chemical data and does not require powdered samples. As a result, the texture of the material can be fully preserved. The sample preparation requirements of the technique are similar to those for standard SEM-EDS, with an additional final polishing step, essential for the removal of surface imperfections, as the EBSD signal is generated on the sample surface. The coupling of EDS and EBSD datasets permits the enhanced interpretation of feature analysis data, allowing for a deeper understanding of the compositional, structural and textural properties of the sample. This, highly-efficient, in-situ, bulk material characterisation, is key for the mining industry, as it provides insights for optimising downstream procedures thereby saving time and resources and bolstering throughput and efficiency.</p>
Advanced scanning electron microscopy and X-ray microanalysis by D.E. Newbury, D.C. Joy, P. Echlin, C.E. Fiori, and J.I. Goldstein Plenum Press, New York (1986) ISBN 0-036-42140-2; 454 pages