Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

Solid Angle ◽

Atomic Resolution ◽

X Ray ◽

Transmission Electron ◽

Scanning Transmission ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Energy dispersive X-ray spectroscopy of bimetallic nanoparticles in an aberration corrected scanning transmission electron microscope

Faraday Discussions ◽

10.1039/b706293c ◽

2008 ◽

Vol 138 ◽

pp. 337-351 ◽

Cited By ~ 88

Author(s):

Andrew A. Herzing ◽

Masashi Watanabe ◽

Jennifer K. Edwards ◽

Marco Conte ◽

Zi-Rong Tang ◽

...

Keyword(s):

Electron Microscope ◽

Bimetallic Nanoparticles ◽

Energy Dispersive ◽

X Ray ◽

Transmission Electron ◽

Scanning Transmission ◽

Atomic Resolution Secondary Electron Imaging with Aberration Corrected Scanning Transmission Electron Microscope

Hyomen Kagaku ◽

10.1380/jsssj.34.247 ◽

2013 ◽

Vol 34 (5) ◽

pp. 247-252

Author(s):

Hiromi INADA ◽

Keiji TAMURA ◽

Yuya SUZUKI ◽

Takahiro SATO ◽

Mitsuru KONNO ◽

...

Keyword(s):

Electron Microscope ◽

Secondary Electron ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Imaging ◽

Corrigendum to “Iron redistribution in a zirconium alloy after neutron and proton irradiation studied by energy-dispersive X-ray spectroscopy using an aberration-corrected (scanning) transmission electron microscope” [J. Nucl. Mater. 454 (1–3) (2014) 387–397]

Journal of Nuclear Materials ◽

10.1016/j.jnucmat.2015.09.004 ◽

2015 ◽

Vol 467 ◽

pp. 395-396 ◽

Cited By ~ 1

Author(s):

Elisabeth Marie Francis ◽

A. Harte ◽

P. Frankel ◽

S.J. Haigh ◽

D. Jädernäs ◽

...

Keyword(s):

Electron Microscope ◽

Zirconium Alloy ◽

Proton Irradiation ◽

Energy Dispersive ◽

X Ray ◽

Transmission Electron ◽

Scanning Transmission ◽

Iron redistribution in a zirconium alloy after neutron and proton irradiation studied by energy-dispersive X-ray spectroscopy (EDX) using an aberration-corrected (scanning) transmission electron microscope

Journal of Nuclear Materials ◽

10.1016/j.jnucmat.2014.08.034 ◽

2014 ◽

Vol 454 (1-3) ◽

pp. 387-397 ◽

Cited By ~ 36

Author(s):

E.M. Francis ◽

A. Harte ◽

P. Frankel ◽

S.J. Haigh ◽

D. Jädernäs ◽

...

Keyword(s):

Electron Microscope ◽

Zirconium Alloy ◽

Proton Irradiation ◽

Energy Dispersive ◽

X Ray ◽

Transmission Electron ◽

Scanning Transmission ◽

Erratum: Atomic-resolution chemical analysis using a scanning transmission electron microscope

Nature ◽

10.1038/nature05262 ◽

2006 ◽

Vol 444 (7116) ◽

pp. 235-235 ◽

Cited By ~ 16

Author(s):

N. D. Browning ◽

M. F. Chisholm ◽

S. J. Pennycook

Keyword(s):

Electron Microscope ◽

Chemical Analysis ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission

X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of Al

10.22443/rms.emc2020.1436 ◽

2021 ◽

Author(s):

Thomas Walther ◽

Keyword(s):

Quantum Dots ◽

Electron Microscope ◽

X Ray ◽

Transmission Electron ◽

Scanning Transmission

Correction for Albina et al., Depth sectioning with the aberration-corrected scanning transmission electron microscope

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.0609974103 ◽

2006 ◽

Vol 103 (50) ◽

pp. 19212-19212

Keyword(s):

Electron Microscope ◽

Transmission Electron ◽

Scanning Transmission ◽

Limitations in the X-ray microanalysis of thin foils in a scanning transmission electron microscope

Journal of Microscopy ◽

10.1111/j.1365-2818.1977.tb00021.x ◽

1977 ◽

Vol 110 (2) ◽

pp. 107-112 ◽

Cited By ~ 19

Author(s):

P. Doig ◽

P. E. J. Flewitt

Keyword(s):

Electron Microscope ◽

X Ray ◽

Thin Foils ◽

Transmission Electron ◽

Scanning Transmission

Demonstration of atomic resolution Z-contrast imaging by a JEOL JEM-2010F scanning transmission electron microscope

Journal of Electron Microscopy ◽

10.1093/oxfordjournals.jmicro.a023629 ◽

1998 ◽

Vol 47 (6) ◽

pp. 561-574 ◽

Cited By ~ 70

Author(s):

E. M. James ◽

N. D. Browning ◽

A. W. Nicholls ◽

M. Kawasaki ◽

Y. Xin ◽

...

Keyword(s):

Electron Microscope ◽

Atomic Resolution ◽

Contrast Imaging ◽

Transmission Electron ◽

Scanning Transmission ◽

Z Contrast

MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE

Annual Review of Materials Research ◽

10.1146/annurev.matsci.35.102103.090513 ◽

2005 ◽

Vol 35 (1) ◽

pp. 539-569 ◽

Cited By ~ 150

Author(s):

M. Varela ◽

A.R. Lupini ◽

K. van Benthem ◽

A.Y. Borisevich ◽

M.F. Chisholm ◽

...

Keyword(s):

Electron Microscope ◽

Materials Characterization ◽

Transmission Electron ◽

Scanning Transmission ◽