Microscopy Analysis of Pyramid Formation Evolution with Ultra-Low Concentrated Na2CO3/NaHCO3 Solution on (100) Si for Solar Cell Application

2013 ◽  
Vol 19 (2) ◽  
pp. 285-292 ◽  
Author(s):  
Amada Montesdeoca-Santana ◽  
Alejandro González Orive ◽  
Alberto Hernández Creus ◽  
Benjamín González-Díaz ◽  
Dietmar Borchert ◽  
...  
Keyword(s):  
Solar Cell ◽  
Silicon Solar Cell ◽  
Light Trapping ◽  
Cell Surfaces ◽  
Solar Cell Application ◽  
Force Microscopy ◽  
Surface Areas ◽  
Atomic Force ◽  
Microscopy Analysis ◽  
Microscopy Techniques

AbstractAn analysis of the nucleation mechanism of pyramids formed in (100) silicon in Na2CO3/NaHCO3 solution has been carried out. This texturization process of silicon by means of Na2CO3/NaHCO3 solutions is of special interest because it can be applied to the silicon solar cell industry to texture solar cell surfaces to decrease the front reflection and enhance light trapping in the cells. For this purpose, two microscopy techniques—scanning electron microscopy and atomic force microscopy—have been used to study the different stages of pyramidal nucleation and formation. The different aspects and factors involved in the texturization process require different analysis conditions and microscopy resolution. Tracing the transformation of determined surface areas and structures has been achieved, contributing clarification of the mechanism of pyramid nucleation in Na2CO3/NaHCO3 solutions.

Characterization of porous silicon for solar cell application by atomic force microscopy

1999 ◽  
Author(s):  
I. Simkiene ◽  
Valentinas J. Snitka ◽  
Kestutis Naudzius ◽  
Vaidas Pacebutas ◽  
Mindaugas Rackaitis
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cell ◽  
Porous Silicon ◽  
Solar Cell Application ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals FABRICATION OF AG SB (SXSE1-X)2 /SI HETEROJUNCTION FOR SOLAR CELL APPLICATION

2020 ◽  
pp. 48-56
Author(s):  
Hiba H.ISSA
Keyword(s):  
Thin Films ◽  
Solar Cell ◽  
High Efficiency ◽  
Cubic Phase ◽  
Electrical Measurements ◽  
Solar Cell Application ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mean Size ◽  
Quenching Method

The preparation of the AgSb (SxSe1-x)2 was done by the quenching method. It is a quaternary substance with sulfur. Preparation of AgSb (SxSe1-x)2 thin films with sulfur was done on the glass substrate at room temperature 303K with a pressure vacuum of (0.01) bar by using a technique called pulsed laser deposition at thickness (~100 nanometres). The structural properties of alloys thin films are tested by x-ray diffraction analysis. Our findings showed that all compounds have polycrystalline structure with cubic phase due to the deposition of the AgSb (SxSe1-x)2. The atomic force microscopy is used for showing mean size, wherever mean size decreases, and the roughness becomes more irregularity with the increase of sulphur level in the alloys. The electrical measurements of AgSb (SxSe1-x)2 /p-Si and AgSb (SxSe1-x)2/n-Si heterojunctions which is included I-V properties cell area structures of(0.61) cm2 were measured. The AgSb (SxSe1-x)2/n-Si showed the best results with a maximum open voltage Voc of these heterojunctions with Sulfur level x= 0.4). It was most suitable for solar cell high efficiency (η = 0.07%) at x= 0.4 on n-Si substrate. Keywords: Ag Sb, Quenching Method, Cell Application.

TUNING PROPERTIES AND MORPHOLOGY IN HIGH VINYL CONTENT SBS BLOCK COPOLYMER, A THERMOPLASTIC ELASTOMER VIA THIOL-ENE MODIFICATION

2017 ◽  
Vol 90 (3) ◽  
pp. 550-561 ◽  
Author(s):  
Prithwiraj Mandal ◽  
Siva Ponnupandian ◽  
Soumyadip Choudhury ◽  
Nikhil K. Singha
Keyword(s):  
Block Copolymer ◽  
Thermoplastic Elastomer ◽  
Atomic Force Microscopy Analysis ◽  
Ene Reaction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis ◽  
Styrene Butadiene Styrene ◽  
Styrene Butadiene ◽  
Butadiene Styrene

ABSTRACT Thiol-ene modification of high vinyl content thermoplastic elastomeric styrene butadiene styrene (SBS) block copolymer (BCP) was carried out using different thiolating agents in toluene at 70 °C. 1H NMR analysis confirmed the participation of vinyl double bond in the thiol-ene modification reaction of SBS. Surface morphology of the block copolymers evaluated by atomic force microscopy analysis showed higher roughness after the thiol-ene reaction. The thiol-modified SBS block copolymer showed better adhesion strength and oil resistance properties than the pristine SBS.

scholarly journals Atomic force microscopy analysis of native infectious and inactivated SARS-CoV-2 virions

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Sébastien Lyonnais ◽  
Mathilde Hénaut ◽  
Aymeric Neyret ◽  
Peggy Merida ◽  
Chantal Cazevieille ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Native Conformation ◽  
Force Microscopy ◽  
Enveloped Virus ◽  
Atomic Force ◽  
Afm Imaging ◽  
Level 3 ◽  
Microscopy Analysis ◽  
Virus Morphology ◽  
Nanoscale Level

AbstractSARS-CoV-2 is an enveloped virus responsible for the Coronavirus Disease 2019 (COVID-19) pandemic. Here, single viruses were analyzed by atomic force microscopy (AFM) operating directly in a level 3 biosafety (BSL3) facility, which appeared as a fast and powerful method to assess at the nanoscale level and in 3D infectious virus morphology in its native conformation, or upon inactivation treatments. AFM imaging reveals structurally intact infectious and inactivated SARS-CoV-2 upon low concentration of formaldehyde treatment. This protocol combining AFM and plaque assays allows the preparation of intact inactivated SARS-CoV-2 particles for safe use of samples out of level 3 laboratory to accelerate researches against the COVID-19 pandemic. Overall, we illustrate how adapted BSL3-AFM is a remarkable toolbox for rapid and direct virus analysis based on nanoscale morphology.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

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