Fabrication of a Lift-Out Grid with Electrical Contacts for Focused Ion Beam Preparation of Lamella for In Situ Transmission Electron Microscopy
2013 ◽
Vol 19
(S2)
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pp. 458-459
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Keyword(s):
Ion Beam
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
2016 ◽
Vol 22
(6)
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pp. 1350-1359
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2006 ◽
Vol 438-440
◽
pp. 513-516
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1998 ◽
Vol 4
(3)
◽
pp. 308-316
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2015 ◽
Vol 21
(2)
◽
pp. 298-306
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