scholarly journals Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 1226-1227
Author(s):  
J.M. Yuk ◽  
H.Y. Jeong ◽  
N.Y. Kim ◽  
M.J. Lee ◽  
J.Y. Lee ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Bilayer Graphene ◽  
Direct Mapping ◽  
Transmission Electron ◽  
Stacking Structure ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

scholarly journals Point defects in turbostratic stacked bilayer graphene

Nanoscale ◽  
2017 ◽  
Vol 9 (36) ◽  
pp. 13725-13730 ◽  
Author(s):  
Chuncheng Gong ◽  
Sungwoo Lee ◽  
Suklyun Hong ◽  
Euijoon Yoon ◽  
Gun-Do Lee ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Point Defects ◽  
Density Functional ◽  
Tight Binding ◽  
Bilayer Graphene ◽  
Dynamics Simulation ◽  
Functional Theory ◽  
Transmission Electron ◽  
Aberration Corrected

The point defects in turbostratic bilayer graphene are characterized using aberration-corrected transmission electron microscopy, density functional theory, and tight-binding molecular dynamics simulation.

scholarly journals The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

2010 ◽  
Vol 16 (S2) ◽  
pp. 122-123
Author(s):  
P Specht ◽  
R Gulotty ◽  
D Barton ◽  
R Cieslinski ◽  
S Rozeveld ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
The Impact ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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