Time-Resolved Spectra from Millivolt EELS Data

2014 ◽  
Vol 20 (3) ◽  
pp. 837-846 ◽  
Author(s):  
Chufeng Li ◽  
Ganesh Subramanian ◽  
John C.H. Spence

AbstractThe millivolt energy resolution now obtainable in electron energy-loss spectra (EELS) on the latest monochromated scanning transmission electron microscope corresponds, via the uncertainty principle, to a time range of 414 fs (for 10 meV resolution), and a time resolution of 0.138 fs (for energy range of 30 eV). (Thus, the width of an EELS peak is inversely related to the lifetime of an excitation.) This compares favorably with the latest X-ray free electron lasers. The time evolution of a Drude–Lorentz oscillator may be obtained from an EELS using logarithmic deconvolution followed by Kramers–Kronig analysis to extract the frequency-dependent dielectric function, and a final Fourier transform from frequency to time domain. This time-dependent dielectric function was interpreted as the impulse response of electrons, phonons, or ions based on the Drude–Lorentz theory. The time evolution of electronic oscillators from ice and protein, extracted from low resolution experimental data, were compared. Using higher energy resolution data we have also extracted the time-resolved spectra from excitons in an alkali halide, BaF2. Despite the small scanning transmission electron microscope probe size, delocalization limits the spatial resolution to about 50 nm, which is, nevertheless, better than the millimeter resolution of infrared absorption spectroscopy or Raman spectroscopy.

Author(s):  
J. R. Fields

The energy analysis of electrons scattered by a specimen in a scanning transmission electron microscope can improve contrast as well as aid in chemical identification. In so far as energy analysis is useful, one would like to be able to design a spectrometer which is tailored to his particular needs. In our own case, we require a spectrometer which will accept a parallel incident beam and which will focus the electrons in both the median and perpendicular planes. In addition, since we intend to follow the spectrometer by a detector array rather than a single energy selecting slit, we need as great a dispersion as possible. Therefore, we would like to follow our spectrometer by a magnifying lens. Consequently, the line along which electrons of varying energy are dispersed must be normal to the direction of the central ray at the spectrometer exit.


Author(s):  
M. G. R. Thomson

The variation of contrast and signal to noise ratio with change in detector solid angle in the high resolution scanning transmission electron microscope was discussed in an earlier paper. In that paper the conclusions were that the most favourable conditions for the imaging of isolated single heavy atoms were, using the notation in figure 1, either bright field phase contrast with β0⋍0.5 α0, or dark field with an annular detector subtending an angle between ao and effectively π/2.The microscope is represented simply by the model illustrated in figure 1, and the objective lens is characterised by its coefficient of spherical aberration Cs. All the results for the Scanning Transmission Electron Microscope (STEM) may with care be applied to the Conventional Electron Microscope (CEM). The object atom is represented as detailed in reference 2, except that ϕ(θ) is taken to be the constant ϕ(0) to simplify the integration. This is reasonable for θ ≤ 0.1 θ0, where 60 is the screening angle.


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