scholarly journals Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques

2016 ◽  
Vol 22 (S3) ◽  
pp. 1556-1557 ◽  
Author(s):  
V.P. Oleshko ◽  
K.A. Twedt ◽  
C.L. Soles ◽  
J.J. McClelland
Keyword(s):  
Electron Microscopy ◽  
Ion Beam ◽  
Analytical Electron Microscopy ◽  
Low Energy ◽  
Analytical Electron ◽  
Li Ion ◽  
Microscopy Techniques

Characterization of Si(Li) x-ray detector efficiencies in the low energy range

1986 ◽  
Vol 44 ◽  
pp. 710-711
Author(s):  
G. Wirmark ◽  
G. Wahlberg ◽  
H. Nordén
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Energy Range ◽  
Analytical Electron Microscopy ◽  
Low Energy ◽  
Ratio Method ◽  
X Ray ◽  
Standard Specimens ◽  
Analytical Electron

X-ray microanalysis with windowless or ultra-thin window Si(Li)-detectors is becoming increasingly important in analytical electron microscopy. The most common approach in the quantification of this method is the thin film ratio method.where CA and CB denote the concentrations of elements A and B respectively and IA and IB are the corresponding x-ray intensities. The KAB-factor should ideally be determined from analyses of standard specimens of known compositions.

The Raft-Like Structure of Supported PtRu5

1997 ◽  
Vol 497 ◽  
Author(s):  
J. C. Yang ◽  
S. Bradley ◽  
M. N. Nashner ◽  
R. Nuzzo ◽  
J. M. Gibson
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Carbon Black ◽  
Analytical Electron Microscopy ◽  
Average Diameter ◽  
Atomic Concentration ◽  
Analytical Electron ◽  
Microscopy Techniques

ABSTRACTWe have examined supported PtRus specimens by a variety of electron microscopy techniques, including high resolution, analytical and a novel mass-spectroscopic electron microscopy techniques. Analytical electron microscopy results showed that the relative atomic concentration of Pt to Ru for each PtRu5 cluster is 1 to 5. The average diameter of the clusters was a 15.6Å, and the average number of atoms was measured to be 24 atoms per cluster. The combination of these techniques demonstrate that the PtRu5 clusters are raft-like on the carbon black support.

scholarly journals Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques

2006 ◽  
Vol 12 (S02) ◽  
pp. 534-535 ◽  
Author(s):  
M Watanabe ◽  
D Saxey ◽  
R Zheng ◽  
D Williams ◽  
S Ringer
Keyword(s):  
Electron Microscopy ◽  
Atom Probe Tomography ◽  
Spherical Aberration ◽  
Analytical Electron Microscopy ◽  
Atom Probe ◽  
Atomic Scale ◽  
Analytical Electron ◽  
Microscopy Techniques ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

scholarly journals Microstructural characterization of the tool–chip interface enabled by focused ion beam and analytical electron microscopy

Wear ◽  
2009 ◽  
Vol 266 (11-12) ◽  
pp. 1237-1240 ◽  
Author(s):  
A. Flink ◽  
R. M'Saoubi ◽  
F. Giuliani ◽  
J. Sjölén ◽  
T. Larsson ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Analytical Electron Microscopy ◽  
Microstructural Characterization ◽  
Analytical Electron
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