Analytical electron microscopy and focused ion beam: complementary tool for the imaging of copper sorption onto iron oxide aggregates

This paper presents thermochemical synthesis of copper/alumina nanocomposites in a Cu-Al2O3 system with 1–2.5 wt.% of alumina and their characterization, which included: transmission electron microscopy: focused ion beam (FIB), analytical electron microscopy (AEM) and high resolution transmission electron microscopy (HRTEM). Thermodynamic analysis was used to study the formation mechanism of desirable products during drying, thermal decomposition and reduction processes. Upon synthesis of powders, samples were cold pressed (2 GPa) in tools dimension 8 × 32 × 2 mm and sintered at temperatures within the range 800–1000 °C for 15 to 120 min in a hydrogen atmosphere. Results of characterization showed that dispersion-strengthened compacts could be produced by sintering of thermo-chemically prepared Cu-Al2O3 powders with properties suitable for material application, such as a contact material exhibiting high strength and high electrical conductivity at the same time. Additional research was carried out in order to analyze the application of the obtained nanocomposite powders for the synthesis of copper/alumina nanocomposites by a new method, which is a combination of a thermochemical procedure and mechanical alloying. The measured values of an electric conductivity and hardness were compared with ones in literature, confirming an advantage of the proposed combined strategy.

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Microscopy Society of America

Microscopy and Microanalysis ◽

10.1017/s1431927602021098 ◽

2002 ◽

Vol 8 (I1) ◽

pp. 36-37

Author(s):

Stanley L. Erlandsen

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Analytical Electron Microscopy ◽

Program Committee ◽

Tissue Imaging ◽

Specimen Preparation ◽

Phase Imaging ◽

X Ray ◽

Microbeam Analysis

It is my pleasure to welcome you to Microscopy and Microanalysis 2002, jointly sponsored by the Microscopy Society of America, Microbeam Analysis Society, Microscopy Society of Canada/Société de Microscopie du Canada, and the International Metallographic Society. An excellent program with an outstanding list of invited speakers for symposia has been assembled by the Program Committee consisting of the Chair, Edgar Voelkl, and Co-Chairs, David Piston (MSA), Raynald Gauvin (MAS/MSC), and Allan Lockley (IMS). Highlights of Microscopy and Microanalysis 2002 include the world's largest display of microscopes and related technologies together with outstanding sessions on all aspects of microscopy and microanalysis. Symposia will be held on 3-D electron microscopy of macromolecules and cryo-electron microscopy of macromolecules, the quantitative aspects of X-ray microscopy, confocal microscopy, biomaterials, biological and materials specimen preparation. Special sessions will be held on holography, phase imaging, deep tissue imaging, (S)TEM instrumentation, developments in focused-ion beam instruments and imaging, metallographic specimen preparation from start to finish, and the changing role of atom probe microscopes in the nanotechnology era. Advances in immunolabeling, EELS, and detectors for X-ray microanalysis also will be presented. A special analytical electron microscopy session honoring the work of Elmar Zeitler is also scheduled. A pre-meetingworkshop “Future of Materials Characterization of Charging Materialsusing Microbeam Analysis” organized by Dr. Raynald Gauvin will be held at McGill University in Montreal on August 2–3. The Local Arrangements Committee, headed by Pierre Charest, has coordinated the scheduling of many local events to complement the meeting.

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Application of Analytical Electron Microscopy to Ion Implantation and Near Surface Microstructures

MRS Proceedings ◽

10.1557/proc-62-73 ◽

1985 ◽

Vol 62 ◽

Author(s):

P. S. Sklad

Keyword(s):

Electron Microscopy ◽

Ion Implantation ◽

Ion Beam ◽

Analytical Electron Microscopy ◽

Theoretical Models ◽

Solute Concentration ◽

Specimen Preparation ◽

Second Phase ◽

Near Surface ◽

Analytical Electron

ABSTRACTSurface modification using ion beam techniques is recognized as an important method for improving surface controlled properties of metallic, ceramic, and semiconductor materials. Determination of the microstructure and composition in regions located within a few hundred nanometers of the surface is essential to gaining an understanding of the mechanisms responsible for the improved properties. Analytical electron microscopy (AEM), high resolution microscopy, and microdiffraction are ideally suited for this purpose. These techniques are powerful tools for characterizing microstructure in terms of solute concentration profiles, second phase formation, lattice damage, crystallinity of the implanted layer and annealing behavior. Such analyses allow correlations with theoretical models, property measurements and results of complementary techniques. The proximity of the regions of interest to the surface also places stringent requirements on specimen preparation techniques. The power of AEM in examining the effects of ion implantation will be illustrated by reviewing the results of several investigations. A brief discussion of some important aspects of specimen preparation will also be included.

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Evaluation of TEM-Lamella Oxidation

ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2014p0148 ◽

2014 ◽

Author(s):

Thomas Haber ◽

Christian Gspan

Keyword(s):

Focused Ion Beam ◽

Ion Beam ◽

Analytical Electron Microscopy ◽

High Resistivity ◽

Root Cause ◽

Ohmic Behavior ◽

Analytical Electron ◽

Tem Lamella ◽

Scanning Electron ◽

Beam Instrument

Abstract This study investigated the origin of detrimental high ohmic behavior of contacts by means of analytical electron microscopy. The root cause for the high resistivity could be identified as delamination of the contact bottom in the nanometer range. Based on the results, we were able to establish a method to identify thin oxide layers using analytical methods without being able to spatially resolve them in a combined focused ion beam instrument and scanning electron microscope.

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Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques

Microscopy and Microanalysis ◽

10.1017/s143192761600862x ◽

2016 ◽

Vol 22 (S3) ◽

pp. 1556-1557 ◽

Cited By ~ 2

Author(s):

V.P. Oleshko ◽

K.A. Twedt ◽

C.L. Soles ◽

J.J. McClelland

Keyword(s):

Electron Microscopy ◽

Ion Beam ◽

Analytical Electron Microscopy ◽

Low Energy ◽

Analytical Electron ◽

Li Ion ◽

Microscopy Techniques

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FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient

Microscopy and Microanalysis ◽

10.1017/s1431927612013876 ◽

2013 ◽

Vol 19 (1) ◽

pp. 79-84 ◽

Cited By ~ 3

Author(s):

Aldo Armigliato ◽

Stefano Frabboni ◽

Gian Carlo Gazzadi ◽

Rodolfo Rosa

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Analytical Electron Microscopy ◽

X Ray ◽

Transmission Electron ◽

The Monte Carlo Method ◽

Scanning Transmission ◽

Reliable Quantification ◽

Experimental Values

AbstractA method for the fabrication of a wedge-shaped thin NiO lamella by focused ion beam is reported. The starting sample is an oxidized bulk single crystalline, ⟨100⟩ oriented, Ni commercial standard. The lamella is employed for the determination, by analytical electron microscopy at 200 kV of the experimental k(O-Ni) Cliff-Lorimer (G. Cliff & G.W. Lorimer, J Microsc103, 203–207, 1975) coefficient, according to the extrapolation method by Van Cappellen (E. Van Cappellen, Microsc Microstruct Microanal1, 1–22, 1990). The result thus obtained is compared to the theoretical k(O-Ni) values either implemented into the commercial software for X-ray microanalysis quantification of the scanning transmission electron microscopy/energy dispersive spectrometry equipment or calculated by the Monte Carlo method. Significant differences among the three values are found. This confirms that for a reliable quantification of binary alloys containing light elements, the choice of the Cliff-Lorimer coefficients is crucial and experimental values are recommended.

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Nanocomposite powders for new contact materials based on copper and alumina

Chemical Industry and Chemical Engineering Quarterly ◽

10.2298/ciceq0804215k ◽

2008 ◽

Vol 14 (4) ◽

pp. 215-218 ◽

Cited By ~ 10

Author(s):

Marija Korac ◽

Zeljko Kamberovic ◽

Milos Tasic ◽

Milorad Gavrilovski

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Analytical Electron Microscopy ◽

Copper Matrix ◽

X Ray Diffraction ◽

Characterization Methods ◽

Contact Materials ◽

Transmission Electron ◽

Nanocomposite Powders

This paper is a contribution to characterization of Cu-Al2O3 powders with nanostructure designed for the production of dispersion strengthened contact materials. New materials with predetermined properties can be successfully synthesized by utilizing the principles of hydrometallurgy and powder metallurgy. The results show a development of a new procedure for the synthesis. The applied characterization methods were differential thermal and thermogravimetric analysis (DTA-TGA), X-ray diffraction (XRD), scanning electron microscopy (SEM), Transmission Electron Microscopy (TEM): Focused Ion Beam (FIB) and Analytical Electron Microscopy (AEM). Nanostructure characteristics, particle size in range 20-50 nm, and uniform distribution of dispersoide in copper matrix were validated.

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