Direct Compositional Analysis of Ordered Domains in Pure and La-Doped Pb(Mg1/3Nb2/3)O3 by Analytical Electron Microscopy Techniques

2004 ◽  
Vol 84 (9) ◽  
pp. 2091-2095 ◽  
Author(s):  
Shu Miao ◽  
Xiaowen Zhang ◽  
Jing Zhu
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Compositional Analysis ◽  
Analytical Electron ◽  
Microscopy Techniques ◽  
La Doped

The Raft-Like Structure of Supported PtRu5

1997 ◽  
Vol 497 ◽  
Author(s):  
J. C. Yang ◽  
S. Bradley ◽  
M. N. Nashner ◽  
R. Nuzzo ◽  
J. M. Gibson
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Carbon Black ◽  
Analytical Electron Microscopy ◽  
Average Diameter ◽  
Atomic Concentration ◽  
Analytical Electron ◽  
Microscopy Techniques

ABSTRACTWe have examined supported PtRus specimens by a variety of electron microscopy techniques, including high resolution, analytical and a novel mass-spectroscopic electron microscopy techniques. Analytical electron microscopy results showed that the relative atomic concentration of Pt to Ru for each PtRu5 cluster is 1 to 5. The average diameter of the clusters was a 15.6Å, and the average number of atoms was measured to be 24 atoms per cluster. The combination of these techniques demonstrate that the PtRu5 clusters are raft-like on the carbon black support.

scholarly journals Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques

2006 ◽  
Vol 12 (S02) ◽  
pp. 534-535 ◽  
Author(s):  
M Watanabe ◽  
D Saxey ◽  
R Zheng ◽  
D Williams ◽  
S Ringer
Keyword(s):  
Electron Microscopy ◽  
Atom Probe Tomography ◽  
Spherical Aberration ◽  
Analytical Electron Microscopy ◽  
Atom Probe ◽  
Atomic Scale ◽  
Analytical Electron ◽  
Microscopy Techniques ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

An overview of Analytical Electron Microscopy

1983 ◽  
Vol 31 ◽  
Author(s):  
D. B. Williams
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Structure Data ◽  
Crystal Structure Data ◽  
Analytical Electron Microscopy ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Microscopy Techniques

ABSTRACTAnalytical electron microscopy techniques comprising imaging, chemical analysis and microdiffraction are described together with details of the instrumentation required. Using the analytical electron microscope (AEM), the materials scientist can gain combined chemical and crystallographic information with a spatial resolution and sensitivity not available in other imaging instruments. Examples of the application of the AEM to determine solute distribution and crystal structure data are given.

Electron Beam Damage of Biomolecules Assessed by Energy Loss Spectroscopy

1978 ◽  
Vol 36 (3) ◽  
pp. 61-69
Author(s):  
M. Isaacson ◽  
M.L. Collins ◽  
M. Listvan
Keyword(s):  
Electron Microscopy ◽  
Radiation Damage ◽  
Structural Integrity ◽  
Analytical Electron Microscopy ◽  
High Dose ◽  
Dose Rates ◽  
Special Cases ◽  
Analytical Electron ◽  
Atom Migration ◽  
Beam Damage

Over the past five years it has become evident that radiation damage provides the fundamental limit to the study of blomolecular structure by electron microscopy. In some special cases structural determinations at very low doses can be achieved through superposition techniques to study periodic (Unwin & Henderson, 1975) and nonperiodic (Saxton & Frank, 1977) specimens. In addition, protection methods such as glucose embedding (Unwin & Henderson, 1975) and maintenance of specimen hydration at low temperatures (Taylor & Glaeser, 1976) have also shown promise. Despite these successes, the basic nature of radiation damage in the electron microscope is far from clear. In general we cannot predict exactly how different structures will behave during electron Irradiation at high dose rates. Moreover, with the rapid rise of analytical electron microscopy over the last few years, nvicroscopists are becoming concerned with questions of compositional as well as structural integrity. It is important to measure changes in elemental composition arising from atom migration in or loss from the specimen as a result of electron bombardment.

Analytical Electron Microscopy (AEM) of Meningeal Cells Exposed to Particulate Cobalt During Studies of Experimental Epilepsy

1982 ◽  
Vol 40 ◽  
pp. 186-187
Author(s):  
R.G. Frederickson ◽  
R.G. Ulrich ◽  
J.L. Culberson
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Experimental Epilepsy ◽  
Metallic Cobalt ◽  
Experimental Animals ◽  
X Ray ◽  
Brain Surface ◽  
Meningeal Cells ◽  
Analytical Electron ◽  
The Brain

Metallic cobalt acts as an epileptogenic agent when placed on the brain surface of some experimental animals. The mechanism by which this substance produces abnormal neuronal discharge is unknown. One potentially useful approach to this problem is to study the cellular and extracellular distribution of elemental cobalt in the meninges and adjacent cerebral cortex. Since it is possible to demonstrate the morphological localization and distribution of heavy metals, such as cobalt, by correlative x-ray analysis and electron microscopy (i.e., by AEM), we are using AEM to locate and identify elemental cobalt in phagocytic meningeal cells of young 80-day postnatal opossums following a subdural injection of cobalt particles.

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