scholarly journals Quantitative EPMA of Nitrogen in Silicate Glasses

2016 ◽  
Vol 22 (S3) ◽  
pp. 1810-1811 ◽  
Author(s):  
Anette von der Handt ◽  
Celia Dalou
Keyword(s):  
Silicate Glasses ◽  
Quantitative Epma

Direct observations of radiation-enhanced transformations in glass

1983 ◽  
Vol 41 ◽  
pp. 354-355
Author(s):  
J. F. DeNatale ◽  
D. G. Howitt
Keyword(s):  
Glass Matrix ◽  
Diffusion Mechanism ◽  
Bubble Formation ◽  
Silicate Glasses ◽  
Phase Decomposition ◽  
Direct Observations ◽  
Thin Foils ◽  
Oxygen Bubble ◽  
Electron Energy Loss ◽  
Kinetics Of

The electron irradiation of silicate glasses containing metal cations produces various types of phase separation and decomposition which includes oxygen bubble formation at intermediate temperatures figure I. The kinetics of bubble formation are too rapid to be accounted for by oxygen diffusion but the behavior is consistent with a cation diffusion mechanism if the amount of oxygen in the bubble is not significantly different from that in the same volume of silicate glass. The formation of oxygen bubbles is often accompanied by precipitation of crystalline phases and/or amorphous phase decomposition in the regions between the bubbles and the detection of differences in oxygen concentration between the bubble and matrix by electron energy loss spectroscopy cannot be discerned (figure 2) even when the bubble occupies the majority of the foil depth.The oxygen bubbles are stable, even in the thin foils, months after irradiation and if van der Waals behavior of the interior gas is assumed an oxygen pressure of about 4000 atmospheres must be sustained for a 100 bubble if the surface tension with the glass matrix is to balance against it at intermediate temperatures.

Quantitative EPMA of nitrogen : A tricky element in the electron-probe microanalyzer

1992 ◽  
Vol 50 (2) ◽  
pp. 1622-1623
Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers
Keyword(s):  
Background Subtraction ◽  
Electron Probe ◽  
Detection System ◽  
Higher Order ◽  
Light Elements ◽  
Strong Suppression ◽  
Electron Probe Microanalyzer ◽  
Quantitative Epma ◽  
Peak Count ◽  
Lead Stearate

Among the ultra-light elements B, C, N, and O nitrogen is the most difficult element to deal with in the electron probe microanalyzer. This is mainly caused by the severe absorption that N-Kα radiation suffers in carbon which is abundantly present in the detection system (lead-stearate crystal, carbonaceous counter window). As a result the peak-to-background ratios for N-Kα measured with a conventional lead-stearate crystal can attain values well below unity in many binary nitrides . An additional complication can be caused by the presence of interfering higher-order reflections from the metal partner in the nitride specimen; notorious examples are elements such as Zr and Nb. In nitrides containing these elements is is virtually impossible to carry out an accurate background subtraction which becomes increasingly important with lower and lower peak-to-background ratios. The use of a synthetic multilayer crystal such as W/Si (2d-spacing 59.8 Å) can bring significant improvements in terms of both higher peak count rates as well as a strong suppression of higher-order reflections.

Coloration of Ce-doped Multicomponent Silicate Glasses by Electron Irradiation

2014 ◽  
Vol 29 (10) ◽  
pp. 1018
Author(s):  
FU Xin-Jie ◽  
SONG Li-Xin ◽  
LI Jia-Cheng
Keyword(s):  
Electron Irradiation ◽  
Silicate Glasses

Europium oxidation state and local structure in silicate glasses

2012 ◽  
Vol 97 (5-6) ◽  
pp. 918-929 ◽  
Author(s):  
M. R. Cicconi ◽  
G. Giuli ◽  
E. Paris ◽  
W. Ertel-Ingrisch ◽  
P. Ulmer ◽  
...  
Keyword(s):  
Oxidation State ◽  
Local Structure ◽  
Silicate Glasses ◽  
State And Local

scholarly journals Modeling the Nanoindentation Response of Silicate Glasses by Peridynamic Simulations

2021 ◽  
Author(s):  
Yuzhe Cao ◽  
Maryam Kazembeyki ◽  
Longwen Tang ◽  
NM Anoop Krishnan ◽  
Morten M. Smedskjaer ◽  
...  
Keyword(s):  
Silicate Glasses

Thermal, structural and optical behaviour of Eu3+ ions in Zinc Alumino Boro-Silicate glasses for bright red emissions

2021 ◽  
pp. 124787
Author(s):  
M. Monisha ◽  
M.S. Murari ◽  
M.I. Sayyed ◽  
Hanan Al-Ghamdi ◽  
Aljawhara H. Almuqrin ◽  
...  
Keyword(s):  
Silicate Glasses ◽  
Optical Behaviour

scholarly journals Low-temperature nucleation anomaly in silicate glasses shown to be artifact in a 5BaO·8SiO2 glass

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Xinsheng Xia ◽  
D. C. Van Hoesen ◽  
Matthew E. McKenzie ◽  
Randall E. Youngman ◽  
K. F. Kelton
Keyword(s):  
Nucleation Rate ◽  
Experimental Approach ◽  
Cluster Formation ◽  
Heating Time ◽  
Silicate Glasses ◽  
Nucleation Theory ◽  
Classical Nucleation Theory ◽  
Real Phenomenon ◽  
Satisfactory Answer ◽  
Over 40 Years

AbstractFor over 40 years, measurements of the nucleation rates in a large number of silicate glasses have indicated a breakdown in the Classical Nucleation Theory at temperatures below that of the peak nucleation rate. The data show that instead of steadily decreasing with decreasing temperature, the work of critical cluster formation enters a plateau and even starts to increase. Many explanations have been offered to explain this anomaly, but none have provided a satisfactory answer. We present an experimental approach to demonstrate explicitly for the example of a 5BaO ∙ 8SiO2 glass that the anomaly is not a real phenomenon, but instead an artifact arising from an insufficient heating time at low temperatures. Heating times much longer than previously used at a temperature 50 K below the peak nucleation rate temperature give results that are consistent with the predictions of the Classical Nucleation Theory. These results raise the question of whether the claimed anomaly is also an artifact in other glasses.

Measurement And Simulation Of X-Ray Emission From Multilayered Structures In Electron Probe Microanalysis.

1999 ◽  
Vol 5 (S2) ◽  
pp. 78-79
Author(s):  
C. Merlet ◽  
X. Llovet ◽  
F. Salvat
Keyword(s):  
Electron Probe ◽  
Numerical Models ◽  
Carbon Layer ◽  
Single Element ◽  
Surface Ionization ◽  
Copper Films ◽  
Multilayered Structures ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Quantitative Epma

Studies of x-ray emission from thin films on substrates using an electron probe microanalyzer (EPMA) provide useful information on the characteristics of x-ray generation by electron beams. In this study, EPMA measurements of multilayered samples were performed in order to test and improve analytical and numerical models used for quantitative EPMA. These models provide relatively accurate results for samples consisting of layers with similar average atomic numbers, because of their similar properties regarding electron transport and x-ray generation. On the contrary, these models find difficulties to describe the process when the various layers have very different atomic numbers. In a previous work, we studied the surface ionization of thin copper films of various thicknesses deposited on substrates with very different atomic numbers. In the present communication, the study is extended to the case of multilayered specimens.The studied specimens consisted of thin copper films deposited on a carbon layer which, in turn, was placed on a variety of single-element substrates, ranging from Be to Bi.

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