scholarly journals 2D Junction Profiling on Semiconductor Device Reliability Fail

2017 ◽  
Vol 23 (S1) ◽  
pp. 1510-1511 ◽  
Author(s):  
Y.Y. Wang ◽  
J. Nxumalo ◽  
A. Katnani ◽  
D. Ioannou ◽  
J. Brown ◽  
...  
Keyword(s):  
Semiconductor Device ◽  
Device Reliability ◽  
Semiconductor Device Reliability

Improved Semiconductor Device Reliability from Plasma Dicing

2019 ◽  
Author(s):  
R. Barnett ◽  
Janet Hopkins ◽  
Stewart Fulton ◽  
Oliver Ansell ◽  
Samira Kazemi ◽  
...  
Keyword(s):  
Semiconductor Device ◽  
Device Reliability ◽  
Semiconductor Device Reliability

Silicon Wafer Orientation Dependence of Metal Oxide Semiconductor Device Reliability

1994 ◽  
Vol 33 (Part 1, No. 1B) ◽  
pp. 500-504 ◽  
Author(s):  
Kou Nakamura ◽  
Kazuyuki Ohmi ◽  
Kazuma Yamamoto ◽  
Koji Makihara ◽  
Tadahiro Ohmi
Keyword(s):  
Metal Oxide ◽  
Silicon Wafer ◽  
Semiconductor Device ◽  
Orientation Dependence ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Device Reliability ◽  
Semiconductor Device Reliability ◽  
Wafer Orientation

Elements of semiconductor-device reliability

1974 ◽  
Vol 62 (2) ◽  
pp. 149-168 ◽  
Author(s):  
C.G. Peattie ◽  
J.D. Adams ◽  
S.L. Carrell ◽  
T.D. George ◽  
M.H. Valek
Keyword(s):  
Semiconductor Device ◽  
Device Reliability ◽  
Semiconductor Device Reliability
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