Bravais Lattice of TiAl Determined from a Single Electron Backscatter Diffraction Pattern

Theab initioderivation of the Bravais lattice from the Kikuchi bands detected from a single electron backscatter diffraction (EBSD) pattern is successfully performed. The as-measured band widths and azimuths always suffer from gnomonic distortions which need to be corrected. A primitive reciprocal cell is first reconstructed by means of the corrected data and the cell parameters are then refined by least-squares analysis of hugely over-determined equations. This allows one to further derive a Niggli reduced cell from the primitive cell. The algorithm presented is not related to any crystal symmetry information and is therefore applicable to all crystal systems. The feasibility of the determination of the Bravais lattice type and parameters from a single EBSD pattern is demonstrated using a mineral sample without anya prioriinformation about its crystal structure. The novel application developed in the present work opens the way to the determination of the Bravais lattice of crystalline materials using scanning electron microscopy combined with the EBSD technique.

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Identification of intermetallic phases in a eutectic Al?Si casting alloy using electron backscatter diffraction pattern analysis

Scripta Materialia ◽

10.1016/j.scriptamat.2004.04.015 ◽

2004 ◽

Vol 51 (3) ◽

pp. 215-219 ◽

Cited By ~ 81

Author(s):

M KRAL

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

Electron Backscatter Diffraction ◽

Intermetallic Phases ◽

Casting Alloy ◽

Electron Backscatter ◽

Backscatter Diffraction

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A study on the indexing method of the electron backscatter diffraction pattern assisted by the Kikuchi bandwidth

Journal of Microscopy ◽

10.1111/jmi.12856 ◽

2019 ◽

Vol 277 (1) ◽

pp. 3-11

Author(s):

F. PENG ◽

Y. ZHANG ◽

J. ZHANG ◽

C. LIN ◽

C. JIANG ◽

...

Keyword(s):

Diffraction Pattern ◽

Electron Backscatter Diffraction ◽

Indexing Method ◽

Electron Backscatter ◽

Backscatter Diffraction

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Application of an electron backscatter diffraction pattern to Cu damascene-fabricated interconnections filled by a high-pressure anneal process

Journal of Electronic Materials ◽

10.1007/s11664-002-0167-7 ◽

2002 ◽

Vol 31 (1) ◽

pp. 16-22 ◽

Cited By ~ 1

Author(s):

Rika Yoda ◽

Sumio Nakazawa ◽

Takashi Onishi

Keyword(s):

High Pressure ◽

Diffraction Pattern ◽

Electron Backscatter Diffraction ◽

Electron Backscatter ◽

Backscatter Diffraction

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Electron backscatter diffraction pattern analysis of the deformation band formed in the Mg-based long-period stacking ordered phase

Scripta Materialia ◽

10.1016/j.scriptamat.2016.02.016 ◽

2016 ◽

Vol 117 ◽

pp. 32-36 ◽

Cited By ~ 19

Author(s):

Koji Hagihara ◽

Takuya Okamoto ◽

Michiaki Yamasaki ◽

Yoshihito Kawamura ◽

Takayoshi Nakano

Keyword(s):

Diffraction Pattern ◽

Deformation Band ◽

Pattern Analysis ◽

Electron Backscatter Diffraction ◽

Long Period ◽

Electron Backscatter ◽

Backscatter Diffraction

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Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis

Ultramicroscopy ◽

10.1016/s0304-3991(99)00119-9 ◽

2000 ◽

Vol 81 (2) ◽

pp. 67-81 ◽

Cited By ~ 38

Author(s):

J.R Michael ◽

J.A Eades

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

Electron Backscatter Diffraction ◽

Reciprocal Lattice ◽

Layer Spacing ◽

Electron Backscatter ◽

Backscatter Diffraction

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Mathematical Tools that Connect Different Indexing Analyses

Proceedings ◽

10.3390/proceedings2020062008 ◽

2020 ◽

Vol 62 (1) ◽

pp. 8

Author(s):

Ryoko Oishi-Tomiyasu

Keyword(s):

Powder Diffraction ◽

Figure Of Merit ◽

Electron Backscatter Diffraction ◽

Higher Dimensions ◽

Bravais Lattice ◽

Mathematical Framework ◽

Electron Backscatter ◽

Different Types ◽

2D Data ◽

Backscatter Diffraction

As mathematical tools that can be commonly used for indexing analyses from different types of experimental patterns, we have recently developed (i) rules on forbidden hkl’s that can be used even when the space group and setting are unknown, (ii) an algorithm for error-stable Bravais lattice determination, (iii) generalization of the de Wolff figure of merit for powder diffraction (1D data) to data in higher-dimensions such as Kikuchi patterns (2D data) by electron backscatter diffraction (EBSD). In particular, (ii) could be used in a variety of situations, not just for indexing. It is explained how (i)–(iii) are used in the mathematical framework of our indexing algorithms.

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Distribution rules of systematic absences and generalized de Wolff figures of merit applied to electron backscatter diffraction ab initio indexing

Journal of Applied Crystallography ◽

10.1107/s1600576721002120 ◽

2021 ◽

Vol 54 (2) ◽

pp. 624-635

Author(s):

Ryoko Oishi-Tomiyasu ◽

Tomohito Tanaka ◽

Jun'ichi Nakagawa

Keyword(s):

Ab Initio ◽

Electron Backscatter Diffraction ◽

Negative Influence ◽

Bravais Lattice ◽

Cell Parameters ◽

Figures Of Merit ◽

Distribution Rules ◽

Electron Backscatter ◽

Backscatter Diffraction ◽

Orientation Determination

A new method for electron backscatter diffraction ab initio indexing is reported that adopts several methods originally invented for powder indexing. Distribution rules of systematic absences and error-stable Bravais lattice determination are used to eliminate the negative influence of non-visible bands and erroneous information from visible bands. In addition, generalized versions of the de Wolff figures of merit are proposed as a new sorting criterion for the obtained unit-cell parameters, which can be used in both orientation determination and ab initio indexing from Kikuchi patterns. Computational results show that the new figures of merit work well, similar to the original de Wolff Mn . The ambiguity of the indexing solutions is also pointed out, which happens in particular for low-symmetry cells and may generate multiple distinct solutions even if very accurate positions of band centre lines and the projection centre are given. It is supposed that this is the reason why indexing was successful in an orthorhombic case but not in a triclinic cell.

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