scholarly journals Power of TOF-SIMS Tandem MS Imaging: Industrial Problem Solving to Investigating Nature

2020 ◽  
Vol 26 (S2) ◽  
pp. 2996-2996
Author(s):  
Andrew Giordani ◽  
David Carr ◽  
Ashley Ellsworth ◽  
Scott Bryan ◽  
Gregory Fisher
2018 ◽  
Vol 16 (3) ◽  
pp. 58
Author(s):  
Peter Rowlett

Part of the 'Review a legacy resource' feature, this article offers a review of the wiki created by the project Industrial Problem Solving for Higher Education (IPSHE), which offers a collection of mathematics project briefs inspired by industrial collaborations suitable for all undergraduate levels. This article provides a brief overview of the IPSHE resource.


Technometrics ◽  
1992 ◽  
Vol 34 (2) ◽  
pp. 234
Author(s):  
Brady Boggs ◽  
L. E. Cook

2017 ◽  
Vol 23 (4) ◽  
pp. 843-848 ◽  
Author(s):  
Gregory L. Fisher ◽  
John S. Hammond ◽  
Scott R. Bryan ◽  
Paul E. Larson ◽  
Ron M. A. Heeren

AbstractWe present the first demonstration of a general method for the chemical characterization of small surface features at high magnification via simultaneous collection of mass spectrometry (MS) imaging and tandem MS imaging data. High lateral resolution tandem secondary ion MS imaging is employed to determine the composition of surface features on poly(ethylene terephthalate) (PET) that precipitate during heat treatment. The surface features, probed at a lateral resolving power of<200 nm using a surface-sensitive ion beam, are found to be comprised of ethylene terephthalate trimer at a greater abundance than is observed in the surrounding polymer matrix. This is the first chemical identification of PET surface precipitates made without either an extraction step or the use of a reference material. The new capability employed for this study achieves the highest practical lateral resolution ever reported for tandem MS imaging.


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