ϕ(ρz) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis Program

Microscopy and Microanalysis ◽

10.1017/s1431927620024927 ◽

2021 ◽

Vol 27 (2) ◽

pp. 284-296

Author(s):

Aurélien Moy ◽

John Fournelle

Keyword(s):

Thin Film ◽

Analysis Program ◽

Film Analysis ◽

Thin Film Analysis

Abstract

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BadgerFilm: An Open Source Thin Film Analysis Program

Microscopy and Microanalysis ◽

10.1017/s1431927620014853 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 496-498

Author(s):

Aurélien Moy ◽

John Fournelle

Keyword(s):

Thin Film ◽

Open Source ◽

Analysis Program ◽

Film Analysis ◽

Thin Film Analysis

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BadgerFilm: a versatile thin film analysis program for EPMA and more

Microscopy and Microanalysis ◽

10.1017/s1431927621006115 ◽

2021 ◽

Vol 27 (S1) ◽

pp. 1658-1660

Author(s):

Aurélien Moy ◽

John Fournelle

Keyword(s):

Thin Film ◽

Analysis Program ◽

Film Analysis ◽

Thin Film Analysis

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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis

10.3403/30206251 ◽

2013 ◽

Keyword(s):

Thin Film ◽

Chemical Analysis ◽

Photoelectron Spectroscopy ◽

Surface Chemical ◽

Film Analysis ◽

X Ray ◽

Thin Film Analysis ◽

Surface Chemical Analysis

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Acquisition of Surface/Thin Film Analysis System

10.21236/ada402919 ◽

2002 ◽

Author(s):

James Stoffer ◽

George D. Weddill ◽

Thomas O'Keefe ◽

Richard Brow ◽

Matt O'Keefe

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis ◽

Analysis System

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Depth microscopy for thin film analysis

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/0168-9002(93)90549-w ◽

1993 ◽

Vol 334 (1) ◽

pp. 187-190 ◽

Author(s):

G. Dollinger ◽

M. Boulouednine ◽

T. Faestermann ◽

P. Maier-Komor

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis

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Applications of microfocussed ion beams in surface and thin film analysis

Vacuum ◽

10.1016/0042-207x(87)90011-x ◽

1987 ◽

Vol 37 (3-4) ◽

pp. 289-291 ◽

Author(s):

RE Thurstans ◽

J Wolstenholme

Keyword(s):

Thin Film ◽

Ion Beams ◽

Film Analysis ◽

Thin Film Analysis

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Atomic force microscopy for thin film analysis

Surface and Coatings Technology ◽

10.1016/0257-8972(94)90251-8 ◽

1994 ◽

Vol 68-69 ◽

pp. 770-775 ◽

Author(s):

Roger W. Phillips

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Film Analysis ◽

Force Microscopy ◽

Thin Film Analysis ◽

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MULTILAYER THIN‐FILM ANALYSIS BY ION BACKSCATTERING

Applied Physics Letters ◽

10.1063/1.1653620 ◽

1971 ◽

Vol 18 (5) ◽

pp. 191-194 ◽

Author(s):

S. T. Picraux ◽

F. L. Vook

Keyword(s):

Thin Film ◽

Multilayer Thin Film ◽

Film Analysis ◽

Thin Film Analysis ◽

Ion Backscattering

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Thin film analysis of gadolinium iron oxide and gadolinium iron by a combined ion exchange X-ray fluorescence method

Microchimica Acta ◽

10.1007/bf01216925 ◽

1968 ◽

Vol 56 (4) ◽

pp. 827-832 ◽

Author(s):

I. C. Barlow ◽

R. K. Van Valkenburg

Keyword(s):

Thin Film ◽

Ion Exchange ◽

Fluorescence Method ◽

Film Analysis ◽

X Ray ◽

Thin Film Analysis

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Significance of the channeling surface peak in thin‐film analysis

Applied Physics Letters ◽

10.1063/1.89948 ◽

1978 ◽

Vol 32 (2) ◽

pp. 93-94 ◽

Author(s):

Robert L. Kauffman ◽

L. C. Feldman ◽

P. J. Silverman ◽

R. A. Zuhr

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis

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