Show me your “Hand”: Direct determination of “handedness” in NaCu5S3 chiral crystal via aberration-corrected scanning transmission electron microscopy

Direct Determination ◽

Transmission Electron ◽

Scanning Transmission ◽

Atomic-level handedness determination of chiral crystals using aberration-corrected scanning transmission electron microscopy

Nature Communications ◽

10.1038/s41467-020-15388-5 ◽

2020 ◽

Vol 11 (1) ◽

Cited By ~ 1

Author(s):

Zhuoya Dong ◽

Yanhang Ma

Keyword(s):

Electron Microscopy ◽

Atomic Level ◽

Transmission Electron ◽

Scanning Transmission ◽

Chiral Crystals ◽

Direct determination of structural heterogeneity in metallic glasses using four-dimensional scanning transmission electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2018.09.005 ◽

2018 ◽

Vol 195 ◽

pp. 189-193 ◽

Cited By ~ 14

Author(s):

Soohyun Im ◽

Zhen Chen ◽

Jared M. Johnson ◽

Pengyang Zhao ◽

Geun Hee Yoo ◽

...

Keyword(s):

Electron Microscopy ◽

Metallic Glasses ◽

Direct Determination ◽

Structural Heterogeneity ◽

Transmission Electron ◽

Scanning Transmission

Wavelet image analysis in aberration-corrected scanning transmission electron microscopy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-84 ◽

2004 ◽

pp. 355-358

Keyword(s):

Electron Microscopy ◽

Image Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Wavelet Image ◽

Determination of Nanocluster Sizes from Dark-Field Scanning Transmission Electron Microscopy Images

The Journal of Physical Chemistry C ◽

10.1021/jp710959x ◽

2008 ◽

Vol 112 (6) ◽

pp. 1759-1763 ◽

Cited By ~ 20

Author(s):

Norihiko L. Okamoto ◽

Bryan W. Reed ◽

Shareghe Mehraeen ◽

Apoorva Kulkarni ◽

David Gene Morgan ◽

...

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

Transmission Electron ◽

Scanning Transmission ◽

Microscopy Images

Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

Micron ◽

10.1016/j.micron.2012.04.018 ◽

2012 ◽

Vol 43 (10) ◽

pp. 1068-1072 ◽

Cited By ~ 1

Author(s):

Paul D. Robb ◽

Michael Finnie ◽

Alan J. Craven

Keyword(s):

Electron Microscopy ◽

Transmission Electron ◽

Short Period ◽

Scanning Transmission ◽

Short Period Superlattices ◽

Advances in Imaging and Electron Physics - Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy ◽

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

10.1016/s1076-5670(08)01008-2 ◽

2008 ◽

pp. 283-325 ◽

Cited By ~ 3

Author(s):

Angus I. Kirkland ◽

Peter D. Nellist ◽

Lan-Yun Chang ◽

Sarah J. Haigh

Keyword(s):

Electron Microscopy ◽

Conventional Transmission Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Direct determination of a topmost atomic layer of (100) surfaces on (La 0.3 Sr 0.7 )(Al 0.65 Ta 0.35 )O 3 single crystals annealed in air by high‐resolution scanning transmission electron microscopy

Surface and Interface Analysis ◽

10.1002/sia.7043 ◽

2021 ◽

Author(s):

Yoshinori Tokuda ◽

Takeshi Irimoto ◽

Naoki Nishikawa ◽

Yutaro Katsuyama ◽

Shunsuke Kobayashi ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Single Crystals ◽

Direct Determination ◽

Atomic Layer ◽

Transmission Electron ◽

Scanning Transmission

Tracking oxidation of individual iron nanoparticles with atomic resolution using aberration-corrected environmental in situ scanning transmission electron microscopy

10.22443/rms.emc2020.1388 ◽

2021 ◽

Author(s):

Roland Kröger ◽

Keyword(s):

Electron Microscopy ◽

Iron Nanoparticles ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927613008180 ◽

2013 ◽

Vol 19 (S2) ◽

pp. 1238-1239

Author(s):

G. Nicotra ◽

Q.M. Ramasse ◽

I. Deretzis ◽

C. Bongiorno ◽

C. Spinella ◽

...

Keyword(s):

Electron Microscopy ◽

Chemical Bonding ◽

Atomic Scale ◽

Scale Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Thickness and Stacking Sequence Determination of Exfoliated Dichalchogenides Using Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927616008126 ◽

2016 ◽

Vol 22 (S3) ◽

pp. 1456-1457

Author(s):

Pengzi Liu ◽

Robert Hovden ◽

Adam W. Tsen ◽

Philip Kim ◽

Abhay N. Pasupathy ◽

...

Keyword(s):

Electron Microscopy ◽

Stacking Sequence ◽

Sequence Determination ◽

Transmission Electron ◽

Scanning Transmission