scholarly journals Deblurring Images

1998 ◽  
Vol 6 (2) ◽  
pp. 8-9
Author(s):  
Everett R. Ramer

If you are an optical microscopist, chances are you have sometimes wished for a way to increase the depth of focus of your images. In this article I describe a method that does this using a simple combination of functions built into most image processing software - so it will not cost you very much to try, The method, however, is not universal and some trial-and-error will be required to get it to work in different applications. Finally, this method is not limited to microscopy and will work with any imaging system.The basic steps for creating an image with a large depth of focus are straight forward:1.Take a series of images at different focal planes2.Remove the blurred content from each image3.Combine the debiurred images into a single image

2012 ◽  
Vol 443-444 ◽  
pp. 488-494
Author(s):  
Xuan Hong Jin ◽  
Zheng Yang Zhou ◽  
Ran Xu

This paper introduces an acquiring and processing system of a new type of optical spectrometer based on vision technology. It mainly introduces the hardware structure to acquire the spectrums dispersed by the spectrometer, and the multi-spectrum image processing software as well. Of the different spectrum wavelengths ranges from 400nm to 740nm, the system can create both the color image and the 68 channels gray scale image. Virtual instruments technology is introduced into this system and it makes programming easier and faster by combining virtual instrument and vision technology. The programming of the image processing software uses LabVIEW platform.


2015 ◽  
Vol 787 ◽  
pp. 917-921
Author(s):  
C. Arun Prakash ◽  
C.S. Saileshwar ◽  
R. Rajkumar ◽  
S. Subash

Inspection plays a major role in any production process. The acceptance or rejection decision of the production lot depends on the inspection results. In recent years, the developments in machine vision techniques have made inspection easier. This paper aims at bottle cap inspection using machine vision techniques. Bottle neck may have defects such as absence of the cap, absence of the tamper ring and improper assembly of cap and tamper ring. This paper deals with checking of the above mentioned defects with a single image of the finished product. This system uses backlight technique. The image of the product obtained using camera is processed using image processing software and then the results obtained are used to accept or reject the particular product. This technique could be implemented in industries for a batch produced series of bottle coming in a conveyor. By using machine vision techniques it is ensured that not even a single defect related to bottle cap is left from observation. Thus the bottle cap inspection becomes easy, accurate and done in less time.


1992 ◽  
Vol 8 (6) ◽  
pp. 583-586
Author(s):  
Mohamed J. Flifla ◽  
Mireille Garreau ◽  
Jean-Paul Rolland ◽  
Jean-Louis Coatrieux ◽  
Daniel Thomas

2000 ◽  
Vol 179 ◽  
pp. 229-232
Author(s):  
Anita Joshi ◽  
Wahab Uddin

AbstractIn this paper we present complete two-dimensional measurements of the observed brightness of the 9th November 1990Hαflare, using a PDS microdensitometer scanner and image processing software MIDAS. The resulting isophotal contour maps, were used to describe morphological-cum-temporal behaviour of the flare and also the kernels of the flare. Correlation of theHαflare with SXR and MW radiations were also studied.


Author(s):  
John A. Hunt ◽  
Richard D. Leapman ◽  
David B. Williams

Interactive MASI involves controlling the raster of a STEM or SEM probe to areas predefined byan integration mask which is formed by image processing, drawing or selecting regions manually. EELS, x-ray, or other spectra are then acquired while the probe is scanning over the areas defined by the integration mask. The technique has several advantages: (1) Low-dose spectra can be acquired by averaging the dose over a great many similar features. (2) MASI can eliminate the risks of spatial under- or over-sampling of multiple, complicated, and irregularly shaped objects. (3) MASI is an extremely rapid and convenient way to record spectra for routine analysis. The technique is performed as follows:Acquire reference imageOptionally blank beam for beam-sensitive specimensUse image processor to select integration mask from reference imageCalculate scanning path for probeUnblank probe (if blanked)Correct for specimen drift since reference image acquisition


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