One of my Failures: Diffraction in the TEM
Keyword(s):
There are two principal techniques for obtaining diffraction patterns in the transmission electron microscope (TEM). They are selected-area diffraction (SAD) and convergent-beam diffraction (CBED). CBED is quicker and easier to use, and it provides a much richer characterization of the sample. Thus, it is clear that CBED should be used in the vast majority of cases. It should be the diffraction technique that students learn first, and students should be taught to consider it the standard method of doing diffraction in the TEM.
1987 ◽
Vol 45
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pp. 30-33
1993 ◽
Vol 51
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pp. 690-691
2017 ◽
Vol 2
(3)
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pp. 174-185
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