Transmission Electron Microscopy Imaging of Structural Transformation Dynamics in a Single Nanocrystal
Keyword(s):
Over the last decade, transmission electron microscopy (TEM) has advanced remarkably. With the development of aberration-corrected optics, improved recording systems, high brightness guns, and so on, imaging with single-atom sensitivity across the periodic table has become a reality. Atomic resolution imaging with rapid acquisition and with greater signal collection efficiency opens many opportunities in the study of dynamic processes of materials.
2020 ◽
Vol 8
(32)
◽
pp. 16142-16165
◽
2010 ◽
Vol 16
(S2)
◽
pp. 80-81
◽
2009 ◽
Vol 42
(3)
◽
pp. 519-524
◽