A proof of concept of a non-resonant near-field microwave microscope based on a high impedance reflectometer

2013 ◽  
Vol 5 (3) ◽  
pp. 301-308
Author(s):  
David Glay ◽  
Adelhatif El Fellahi ◽  
Tuami Lasri
Keyword(s):  
Near Field ◽  
Metal Plate ◽  
Microwave Circuit ◽  
Proof Of Concept ◽  
Capacitance Measurements ◽  
High Impedance ◽  
Microwave Microscope ◽  
Lumped Elements

In this paper, we present a non-resonant high impedance reflectometer with a reference impedance close to one of the tip probe of a near-field microwave microscope. We show that for an apex of the tip probe of 100 µm there is an optimum reference impedance close to 1 kΩ. To validate this approach a microwave circuit that makes use of lumped elements has been fabricated. A proof of concept is also explored for capacitance measurements between the tip probe and a metal plate.

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

High resolution scanning near field mapping of enhancement on SERS substrates: comparison with photoemission electron microscopy

2016 ◽  
Vol 18 (14) ◽  
pp. 9405-9411 ◽  
Author(s):  
C. Awada ◽  
J. Plathier ◽  
C. Dab ◽  
F. Charra ◽  
L. Douillard ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Near Field ◽  
Spectroscopic Technique ◽  
Proof Of Concept ◽  
Sers Substrates ◽  
Surface Enhanced ◽  
Surface Enhanced Raman ◽  
Enhanced Raman Scattering ◽  
Photoemission Electron

The need for a dedicated spectroscopic technique with nanoscale resolution to characterize SERS substrates pushed us to develop a proof of concept of a functionalized tip–surface enhanced Raman scattering (FTERS) technique.

Magnetic permeability imaging of metals with a scanning near-field microwave microscope

2000 ◽  
Vol 77 (26) ◽  
pp. 4404-4406 ◽  
Author(s):  
Sheng-Chiang Lee ◽  
C. P. Vlahacos ◽  
B. J. Feenstra ◽  
Andrew Schwartz ◽  
D. E. Steinhauer ◽  
...  
Keyword(s):  
Magnetic Permeability ◽  
Near Field ◽  
Microwave Microscope

High Sensitivity Electrical Properties Measurement of Graphene-based Composites using Interferometric Near-field Microwave Technique

2021 ◽  
Author(s):  
HIND BAKLI ◽  
Mohamed MOUALHI ◽  
Mourad Makhlouf
Keyword(s):  
Composite Material ◽  
Composite Materials ◽  
Electrical Properties ◽  
Near Field ◽  
High Sensitivity ◽  
Calibration Model ◽  
Electrical Model ◽  
Microwave Technique ◽  
Lumped Elements ◽  
Local Properties

Abstract High sensitivity electrical properties measurement of composite materials using an interferometric near-field microwave technique is proposed in this paper. A one-port calibration model is developed to relate the measured transmission coefficient to the local properties of the material. To represent the probe-composite sample interaction, an electrical model based on lumped elements is developed. As a demonstration, complex permittivity and conductivity of composite materials prepared with polyvinyl chloride (PVC) and different concentration of graphene are experimentally determined at 2.45 GHz. The obtained results show that the proposed technique is sensitive for the detection of small contrast of permittivity and conductivity in composite material. When graphene concentration increases from 1 to 30%, the conductivity increases from 0.0061 s/m to 0.056 s/m.

scholarly journals Surface resistance imaging with a scanning near-field microwave microscope

1997 ◽  
Vol 71 (12) ◽  
pp. 1736-1738 ◽  
Author(s):  
D. E. Steinhauer ◽  
C. P. Vlahacos ◽  
S. K. Dutta ◽  
F. C. Wellstood ◽  
Steven M. Anlage
Keyword(s):  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope
Sign in / Sign up

Export Citation Format

Share Document