Characterization of Chloramphenicol Palmitate Drug Polymorphs by Raman Mapping with Multivariate Image Segmentation Using a Spatial Directed Agglomeration Clustering Method

2006 ◽  
Vol 78 (17) ◽  
pp. 6003-6011 ◽  
Author(s):  
Wei-Qi Lin ◽  
Jian-Hui Jiang ◽  
Hai-Feng Yang ◽  
Yukihiro Ozaki ◽  
Guo-Li Shen ◽  
...  
Keyword(s):  
Image Segmentation ◽  
Raman Mapping ◽  
Clustering Method ◽  
Multivariate Image

Combined AFM/Raman Studies of Heterogeneous Polymer Materials

MRS Advances ◽  
2016 ◽  
Vol 1 (25) ◽  
pp. 1859-1864 ◽  
Author(s):  
Marko Surtchev ◽  
Mark Wall ◽  
Sergei Magonov
Keyword(s):  
Surface Morphology ◽  
Polymer Blends ◽  
Heterogeneous Systems ◽  
Polymer Materials ◽  
Raman Mapping ◽  
Immiscible Polymer Blends ◽  
Immiscible Polymer ◽  
Heterogeneous Polymer ◽  
Comprehensive Characterization

ABSTRACTCompositional imaging of several immiscible polymer blends was examined with the combination of AFM-based mechanical and electric modes with chemically-specific Raman mapping. Results showed that these methods substantially complement each other in comprehensive characterization of surface morphology by helping to identify a composition of top surface and sub-surface materials in polymer heterogeneous systems.

Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy

1999 ◽  
Vol 591 ◽  
Author(s):  
P. S. Lee ◽  
D. Mangelinck ◽  
K. L. Pey ◽  
J. Ding ◽  
T. Osipowicz ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Raman Spectroscopy ◽  
Raman Mapping ◽  
Silicide Formation ◽  
Nucleation Sites ◽  
The Difference ◽  
The Stability ◽  
Non Destructive ◽  
Thermal Stability Of

ABSTRACTThe formation and thermal stability of Ni- and Ni(Pt) silicide on narrow polycrystalline Si (poly-Si) lines have been investigated using the non-destructive micro-Raman technique. The presence of Ni or Ni(Pt)Si on poly-Si lines with linewidths ranging from 0.5 gtm to 0.25 μm has been monitored by a distinct Raman peak at around 215 cm−1. Ni(Pt)Si was clearly identified to be present up to a RTA temperature of 900°C on narrow poly-Si lines as compared to pure NiSi which was found only up to 750°C. Raman scattering from the 100×100 μm2 poly-Si pads showed the formation of NiSi2 at 750°C for pure Ni-salicidation and 900°C for Ni(Pt)-salicidation respectively. The difference in the stability of NiSi on the poly-Si pads and lines is discussed in terms of agglomeration, inversion and/or nucleation of NiSi2that could be due to difference in nucleation sites and/or stress. In addition, a correlation between the line sheet resistance and the presence of Ni silicide was found using micro-Raman mapping along single poly-Si lines.

Characterization of drug–cyclodextrin formulations using Raman mapping and multivariate curve resolution

2011 ◽  
Vol 56 (1) ◽  
pp. 38-44 ◽  
Author(s):  
Balázs Vajna ◽  
István Farkas ◽  
Attila Farkas ◽  
Hajnalka Pataki ◽  
Zsombor Nagy ◽  
...  
Keyword(s):  
Multivariate Curve Resolution ◽  
Raman Mapping ◽  
Curve Resolution
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