Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry
2010 ◽
Vol 49
(26)
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pp. 4435-4437
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2012 ◽
Vol 23
(7)
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pp. 1271-1278
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2009 ◽
Vol 24
(4)
◽
pp. 515
◽
2005 ◽
Vol 20
(12)
◽
pp. 1337
◽
2015 ◽
Vol 407
(19)
◽
pp. 5673-5684
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